A harmonic detection device for multi-port nonlinear device
A nonlinear device and harmonic detection technology, applied in the field of microelectronics measurement, can solve the problems of low precision, large dynamic range, difficult multi-port harmonic measurement, etc., and achieve a large dynamic range, wide application range, simple and reasonable structure. Effect
Active Publication Date: 2021-04-30
UNIV OF ELECTRONICS SCI & TECH OF CHINA
View PDF7 Cites 0 Cited by
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
[0003] The main technical problem to be solved by the present invention is to propose a harmonic detection device for multi-port nonlinear devices, which solves the technical problems of difficult multi-port harmonic measurement of microelectronic devices, large dynamic range, and low precision.
Method used
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View moreImage
Smart Image Click on the blue labels to locate them in the text.
Smart ImageViewing Examples
Examples
Experimental program
Comparison scheme
Effect test
Embodiment Construction
[0014] The present invention will be further described below in conjunction with drawings and embodiments.
[0015] A harmonic detection device of a multi-port device, used to detect the harmonic level of each port of the multi-port device, the described device is as figure 2 As shown, including isolator 1, filter 1, isolator 2, directional coupler 1, frequency multiplexer 1 to frequency multiplexer n, spectrum analyzer 0 to spectrum analyzer n, and horizontal substrates, multiplexers A data processing module and a display, wherein n is an integer greater than or equal to 1, and n is consistent with the number n of ports to be detected of the DUT. Each multi-frequency multiplexer includes an input port and m harmonic output ports, and the harmonic output port has a center frequency of fm, which is fixed to be m times the working frequency. The multi-frequency multiplexer can separate the harmonics generated by the DUT port from low order to high order, m is an integer greate...
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More PUM
Login to View More Abstract
The invention discloses a harmonic detection device for multi-port nonlinear devices, relates to the field of microelectronics measurement, in particular a harmonic test device for multi-port nonlinear devices. In order to solve the problem of small and compact structure of microelectronic devices and the difficulty of harmonic testing caused by interference; the present invention selects low-loss and low-reflection devices to avoid energy reflection and loss back and forth, and reduce test errors; for each test port Separately set a signal propagation path to avoid branch interference; use the horizontal substrate to extend and expand the microelectronic device pins to the general signal interface, while keeping the device under test and the device on the same level to improve accuracy. The test device can simultaneously measure multi-port multi-channel harmonic data and input signals, with high test accuracy, large dynamic range and intuitive effect.
Description
technical field [0001] The invention relates to the field of microelectronic measurement, in particular to the field of measuring the distortion level of nonlinear devices, in particular to a harmonic detection device for multi-port nonlinear devices. Background technique [0002] With the rapid development of the microelectronics industry, the circuit integration of wireless electronic equipment products is getting higher and higher, the structure is more compact and more flexible, and the requirements for modern communication quality are more stringent. Most of the microelectronic devices that exist today are nonlinear and will excite a large number of higher harmonics under normal operating conditions. The generated harmonics are a fatal blow to modern communication networks. On the one hand, a large number of harmonics will generate additional harmonic losses, increase system power consumption, and reduce communication efficiency; Device coupling produces severe interfe...
Claims
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More Application Information
Patent Timeline
Login to View More Patent Type & Authority Patents(China)
IPC IPC(8): G01R23/16
CPCG01R23/16
Inventor 何松柏舒晓霞
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA