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Damage threshold calculation method of laser cavity surface

A calculation method and damage threshold technology, which is applied in the field of damage threshold calculation of the laser cavity surface, can solve the problems of reducing the optical performance of the laser chip, limiting the service life of the laser transmission laser, etc.

Pending Publication Date: 2020-06-30
TAIYUAN UNIV OF TECH
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AI Technical Summary

Problems solved by technology

The defects generated in the laser will modulate the incident laser, thereby significantly reducing the optical performance of the laser chip (such as leading to enhanced absorption of incident laser energy, local concentration of laser energy, etc.), which will seriously limit the transmission and Laser service life
[0004] At present, the research on the influence of laser defects on its laser performance mainly focuses on the analysis of the spectral characteristics of the laser after the damage occurs, and does not involve the influence of defects on the free electron density.

Method used

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  • Damage threshold calculation method of laser cavity surface
  • Damage threshold calculation method of laser cavity surface
  • Damage threshold calculation method of laser cavity surface

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Embodiment Construction

[0029] The present invention will be described in further detail below in conjunction with the accompanying drawings.

[0030] like Figure 1~2 As shown, the present invention discloses a method for calculating the damage threshold of the laser cavity surface, theoretically analyzes the influence of the cavity surface material on the free electrons when nonlinearly excited, establishes a theoretical model for the calculation of the laser-induced damage threshold of the cavity surface, and quantitatively analyzes the The law of influence on free electrons during the development of cavity surface damage includes the following steps:

[0031] Step 1. Generate photoionization under the state of strong electric field and low frequency laser irradiation, and use formula (1) to calculate the photoionization rate W based on Keldysh theory PI (I(t)):

[0032]

[0033] in, is the effective ionization potential: is the reduced Planck constant, for The integer part of , I(t...

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Abstract

The invention belongs to the field of semiconductor lasers. At present, the research on the influence of laser defects on the laser performance mainly focuses on the spectral characteristic analysis after the laser damage occurs; the change of the free electron density in the laser cavity surface material is not microscopically analyzed from the perspective of physics; the invention provides a method for calculating a damage threshold of a laser cavity surface. The incident laser irradiates the lower cavity film to generate photoionization, collision ionization and free electron attenuation; the damage threshold value of the laser cavity surface is analyzed and calculated by calculating the critical free electron density of the laser cavity surface, the influence rule of cavity surface material nonlinear excitation on free electrons is theoretically analyzed, and a theoretical model for calculating the cavity surface laser-induced damage threshold value is established.

Description

technical field [0001] The invention belongs to the field of semiconductor lasers, and more specifically relates to a method for calculating the damage threshold of a laser cavity surface. Background technique [0002] In recent years, optical communication technologies represented by optical communication devices and optical transmission systems have achieved rapid development. As the light source of optical communication, laser is the core of the entire optical communication field. How to control the defects of the laser chip and how to deal with them quickly and effectively when the chip is found to be damaged is the key to ensure the safe and effective operation of the laser chip. [0003] In order to improve the damage threshold of the laser cavity surface, a layer of film will be coated on the cavity surface. The function of this film is to reduce the extra energy loss caused by surface reflection. It can be destroyed in a short time, resulting in damage to the cavit...

Claims

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Application Information

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IPC IPC(8): G06F30/20G06F111/10G06F119/04
CPCY02T90/00
Inventor 贾华宇华红洋李灯熬
Owner TAIYUAN UNIV OF TECH
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