Longitudinal high voltage power semiconductor device structure with low relative dielectric constant buried layer
A relative permittivity, power semiconductor technology, applied in semiconductor devices, electrical components, circuits, etc., can solve the problem that the position of device breakdown still exists, the maximum electric field has not been significantly improved, etc., to improve on-resistance, increase Device performance, the effect of reducing power loss
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[0025] Aiming at the above technical solutions, preferred embodiments are given for specific description. Because the structure of the trench IGBT is essentially just adding a layer of P+ layer at the bottom of the trench MOS, and this part of the structure does not affect the withstand voltage performance of the device, only the trench MOS is used as the object for specific description. The principle of the IGBT is similar, not Let me repeat.
[0026] see Figure 6 , including N+ drain region 10, N drift region 11, P base region 12, N+ source region 13, P+ contact layer 14 on the silicon-based material from bottom to top, and at the same time, the N A gate oxide layer 15 is deposited in the device trench on the surface of the drift region, and then a gate conductive dielectric layer 16 is deposited. The material of the gate oxide layer is silicon dioxide, and the material of the gate conductive dielectric layer is polysilicon material. Metal is then deposited on the surface ...
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