Low-temperature drift time-delay circuit

A delay circuit, low temperature drift technology, applied in electrical components, electronic switches, pulse technology, etc., can solve problems such as the influence of single-stage delay of integrated oscillators, achieve simple structure, reduce device area, and fast turn-on speed Effect

Active Publication Date: 2020-09-01
HUAZHONG UNIV OF SCI & TECH
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] Aiming at the defects and improvement needs of the prior art, the present invention provides a low-temperature drift delay circuit, the purpose of which is to solve the problem that the single-stage delay of the on-chip integrated oscillator is affected when the temperature and power supply voltage change

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Embodiment Construction

[0031] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention. In addition, the technical features involved in the various embodiments of the present invention described below can be combined with each other as long as they do not constitute a conflict with each other.

[0032] figure 2 A schematic structural diagram of the oscillator circuit 200 proposed by the present invention includes a bias current source circuit 206 , a ramp voltage generation circuit 207 and a fixed threshold switch circuit 208 .

[0033] Specifically, the negative temperature coefficient current bias 204 generated by the bias current source circuit 206 is mirrored to the slope voltage ...

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Abstract

The invention discloses a low-temperature drift time-delay circuit. The circuit comprises a bias current source circuit, a slope voltage generation circuit and a fixed threshold switching circuit. Thebias current source circuit is used for generating negative temperature coefficient current bias, the input end of the bias current source circuit is connected with power voltage, and the output endof the bias current source circuit is connected with the ramp voltage generation circuit. The bias input end of the ramp voltage generating circuit is connected with the output end of the bias currentsource circuit, the digital signal input end of the ramp voltage generating circuit is connected with digital signal input, and the output end of the ramp voltage generating circuit is connected withthe fixed threshold switching circuit. The pull-down switch input end of the fixed threshold switch circuit is connected with the output end of the ramp voltage generation circuit, the pull-up switchinput end of the fixed threshold switch circuit is connected with digital signal input, and the output end of the fixed threshold switch circuit outputs delayed digital signals. According to the invention, delay processing can be carried out on a digital signal without being influenced by temperature and power supply voltage. The fixed threshold switch circuit adopts a thyristor structure as a pull-down switch, and has the advantages of stable threshold, high speed, simple structure and the like.

Description

technical field [0001] The invention belongs to the technical field of analog integrated circuits, and in particular relates to a low-temperature drift delay circuit. Background technique [0002] As all kinds of electrical appliances have higher and higher requirements for switching power supply chips, the design of switching power supply chip has higher and higher requirements for the oscillator inside the chip. The impact of the operating frequency of a switching power supply chip on chip performance involves parameters such as ripple, loop stability, and maximum load, and even indirectly affects the chip's input voltage range and small signal response speed. Due to the different thermal power generated by the chip under different loads and the temperature change of the environment, the chip works at different temperatures, and the different temperature characteristics of the devices under different processes make the output frequency of the oscillator also affected by te...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H03K17/284
CPCH03K17/284
Inventor 邹雪城尚泽元邹志革童乔凌皮庆广
Owner HUAZHONG UNIV OF SCI & TECH
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