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Preparation method of high-quality AIN template with controllable polarity

A template and polarity technology, applied in the field of nitride semiconductor preparation, can solve the problems of reducing device quantum efficiency and increasing loss, and achieve the effect of improving quantum efficiency, improving device performance, and realizing polarity control

Inactive Publication Date: 2020-09-18
INST OF SEMICONDUCTORS - CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

And the dislocation density of the AlN template provides a non-radiative recombination channel for ultraviolet optoelectronic devices and reduces the quantum efficiency of the device
Dislocations also provide leakage paths for electronic devices, increasing losses

Method used

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  • Preparation method of high-quality AIN template with controllable polarity
  • Preparation method of high-quality AIN template with controllable polarity
  • Preparation method of high-quality AIN template with controllable polarity

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0029] The following will refer to figure 1 Illustrating Embodiment 1 of the present invention, figure 1 The core idea of ​​controlling the polar surface of a high-quality AlN template provided by this embodiment is shown, which specifically includes the following steps:

[0030] The first step is to provide a high temperature resistant substrate, one side of the substrate has an atomically smooth surface or a patterned surface, preferably a sapphire substrate, with a thickness of 350 microns to 500 microns.

[0031] In the second step, the magnetron sputtering technique is used to deposit AlN on the substrate in the first step to make an AlN template. The temperature of the deposition chamber is first raised to the sputtering temperature, and then the substrate is placed in the chamber for sputtering. The sputtering temperature is 25°C-1000°C, preferably, 600°C. Oxygen-containing gas is used during sputtering and is mixed with pure nitrogen or inert gas such as nitrogen an...

Embodiment 2

[0034] The following will refer to image 3 Illustrating Embodiment 2 of the present invention, image 3 The core idea of ​​controlling the polar surface of a high-quality AlN template provided by this embodiment is shown, which specifically includes the following steps:

[0035] The first step is to provide a high temperature resistant substrate, one side of the substrate has an atomically smooth surface or a patterned surface, preferably a sapphire substrate, with a thickness of 350 microns to 500 microns.

[0036] In the second step, the magnetron sputtering technique is used to deposit AlN on the substrate in the first step to make an AlN template. The temperature of the deposition chamber is first raised to the sputtering temperature, and then the substrate is placed in the chamber for sputtering. The sputtering temperature is 25°C-1000°C, preferably, 600°C. During sputtering, pure nitrogen gas is used for sputtering, and the flow rate is 1 sccm-1 slm, and the preferre...

Embodiment 3

[0039] The following will refer to Figure 4 Illustrating Embodiment 3 of the present invention, image 3 The core idea of ​​controlling the polar surface of a high-quality AlN template provided by this embodiment is shown, which specifically includes the following steps:

[0040] The first step is to provide a high temperature resistant substrate, one side of the substrate has an atomically smooth surface or a patterned surface, preferably a sapphire substrate, with a thickness of 350 microns to 500 microns.

[0041] In the second step, the magnetron sputtering technique is used to deposit AlN on the substrate in the first step to make an AlN template. The temperature of the deposition chamber is first raised to the sputtering temperature, and then the substrate is placed in the chamber for sputtering. The sputtering temperature is 25°C-1000°C, preferably, 600°C. During sputtering, inert gases such as nitrogen and argon are used for sputtering. Preferably, the gases used d...

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Abstract

The invention provides a preparation method of an AlN template. The preparation method comprises the following steps that 1, a substrate is provided; 2, an AlN thin film is deposited on the substrateby adopting magnetron sputtering technology, the thickness of the AlN thin film is 0.001 micrometer to 10 micrometers, mixed gas of oxygen-containing gas, pure nitrogen or nitrogen and inert gas is introduced into the process, and a low-quality AlN template is formed; 3, if the oxygen-containing gas is introduced, an Al-polar face high-quality AlN template is obtained; 4, if the oxygen-free gas isintroduced and only nitrogen and inert gas are contained, when the inert gas ratio is low or the sputtering power is low, a nitrogen-rich condition is formed on the surface of the substrate, and a high-quality Al template of an N-polarity face or a mixed polar face is obtained; 5, if the inert gas ratio is high or the sputtering power is high, the surface of the substrate forms an Al-rich condition, and a high-quality AI template of the mixed polar face or the N-polar face is obtained; and 6, the obtained low-quality AlN template is put into a high-temperature chamber for high-temperature annealing treatment to obtain a high-quality AlN template.

Description

technical field [0001] The invention relates to the technical field of nitride semiconductor preparation, in particular to a method for preparing a high-quality AlN template with controllable polarity. Background technique [0002] AlGaN-based deep ultraviolet light emitting diodes (LEDs) have the advantages of high brightness, energy saving and environmental protection, and have been recognized as a new generation of ultraviolet light sources, and have been vigorously developed in recent years. AlGaN power electronic devices, such as HEMT devices, have the characteristics of strong voltage resistance, small size, and low energy loss, and will be widely used. The preparation of these devices generally requires the use of AlN templates, and the polar plane and material quality of AlN directly determine the performance of the device. [0003] The bond energy of nitride semiconductors in the c-axis direction is asymmetric. For different polar planes, the atoms are arranged in...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): C23C14/06C23C14/35C23C14/58
CPCC23C14/0036C23C14/0617C23C14/35C23C14/5806
Inventor 刘志彬郭亚楠闫建昌李晋闽王军喜
Owner INST OF SEMICONDUCTORS - CHINESE ACAD OF SCI