Clamp assembly for testing surface-emitting laser diode and test equipment with same

A laser diode and test surface technology, which is used in diode testing, electrical measuring instrument components, and single semiconductor device testing, etc. , institutional complexity, etc.

Pending Publication Date: 2020-11-13
致茂电子(苏州)有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Therefore, there is no means of clamping the component under test, precise positioning of the component under test, and complete electrical contact between the component under test and the spring probe cannot be ensured
[0005] In addition, take the Chinese Patent No. CN106996990A "Test fixture for simultane...

Method used

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  • Clamp assembly for testing surface-emitting laser diode and test equipment with same
  • Clamp assembly for testing surface-emitting laser diode and test equipment with same
  • Clamp assembly for testing surface-emitting laser diode and test equipment with same

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Embodiment Construction

[0018] Before the fixture assembly for testing surface-emitting laser diodes of the present invention and the testing equipment equipped with the assembly are described in detail in this embodiment, it should be noted that in the following description, similar components will use the same component symbols To represent. Moreover, the drawings of the present invention are only for illustration purposes, they are not necessarily drawn to scale, and not all details are necessarily presented in the drawings.

[0019] Please see first figure 1 , which is a schematic perspective view of a surface-emitting laser diode Ld. Generally speaking, the surface-emitting laser diode Ld includes a light emitting surface Ld1 and a contact surface Ld2, wherein the light emitting surface Ld1 includes a light emitting area Ldz, that is, the laser light is emitted from the light emitting area Ldz. In addition, a plurality of electrical contacts (not shown in the figure) are arranged on the contac...

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Abstract

The invention relates to a clamp assembly for testing a surface-emitting laser diode and test equipment with the assembly. The clamp assembly mainly comprises a base, an upper cover and a locking mechanism. The base comprises an accommodating groove and an electric contact interface, and the electric contact interface is arranged in the accommodating groove. Besides, the upper cover comprises a body, a pressing block and a pressure applying assembly, the pressing block comprises a through hole, the pressing block is coupled to the body and can slide relative to the body, and the pressure applying assembly is assembled on the body. Moreover, the locking mechanism is arranged on at least one of the base and the upper cover, and selectively enables the base and the upper cover to be connectedwith or disconnected from each other. When the locking mechanism enables the base and the upper cover to be jointed with each other, the accommodating groove and the through hole form a through cavity for the laser diode to emit laser.

Description

technical field [0001] The invention relates to a fixture assembly for testing a surface-emitting laser diode and testing equipment with the assembly, in particular to a fixture assembly suitable for fixing and testing a surface-emitting laser diode, and performing optical testing and electrical testing of the diode Test equipment for testing. Background technique [0002] Common surface-emitting laser diodes, such as vertical-cavity surface-emitting lasers (Vertical-Cavity Surface-Emitting Lasers, referred to as VCSELs), have continuously expanded application levels and increasingly strong demands. At present, the market applications of VCSEL surface-emitting lasers have covered distance sensing, auto focus, 3D sensing, iris recognition, and air and water quality detection. Among them, 3D sensing includes gesture recognition (Gesture Recognition), face recognition (FaceRecognition) and so on. [0003] Furthermore, whether it is portable consumer electronics or industrial ...

Claims

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Application Information

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IPC IPC(8): G01R1/04G01R31/26
CPCG01R1/0416G01R31/2635
Inventor J·E·霍普金斯
Owner 致茂电子(苏州)有限公司
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