Clamp assembly for testing surface-emitting laser diode and test equipment with same
A laser diode and test surface technology, which is used in diode testing, electrical measuring instrument components, and single semiconductor device testing, etc. , institutional complexity, etc.
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[0018] Before the fixture assembly for testing surface-emitting laser diodes of the present invention and the testing equipment equipped with the assembly are described in detail in this embodiment, it should be noted that in the following description, similar components will use the same component symbols To represent. Moreover, the drawings of the present invention are only for illustration purposes, they are not necessarily drawn to scale, and not all details are necessarily presented in the drawings.
[0019] Please see first figure 1 , which is a schematic perspective view of a surface-emitting laser diode Ld. Generally speaking, the surface-emitting laser diode Ld includes a light emitting surface Ld1 and a contact surface Ld2, wherein the light emitting surface Ld1 includes a light emitting area Ldz, that is, the laser light is emitted from the light emitting area Ldz. In addition, a plurality of electrical contacts (not shown in the figure) are arranged on the contac...
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