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Optical filter cut-off depth detection method

A technology of cut-off depth and detection method, which is applied in the direction of testing optical properties, etc., can solve the problems of inconvenient transmittance detection, etc., and achieve the effect of strong implementability, simple operation process and high applicability

Active Publication Date: 2020-12-04
CHONGQING UNIV OF TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] Aiming at the above-mentioned deficiencies in the prior art, the technical problem to be solved by the present invention is to provide a cut-off depth detection method of an optical filter, to avoid the inconvenience of detecting the transmittance of some specific wavelengths of the optical filter, and to find out the filter depth conveniently. Which specific wavelengths the chip has absorption problems, so as to achieve the effect of easy judgment and feedback to improve quality

Method used

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  • Optical filter cut-off depth detection method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0039] Light source: UV-visible LED light source, which can emit near-ultraviolet beams and visible light beams in a part of the band.

[0040] Optical fiber: anti-ultraviolet quartz optical fiber, the wavelength range of the light source is 200nm-760nm, and the numerical aperture NA=0.26.

[0041] Collimating lens: fiber optic collimating lens, made of UV fused silica.

[0042] Filter holder: Adjustable filter holder, the clamping range is adjustable from 10-20mm.

[0043] Filter to be tested: 214nm (central wavelength) filter A to be tested.

[0044] Cuvette: Anti-UV cuvette.

[0045] Solution composition: solvent is water, solute is sodium oxalate and potassium permanganate (content ratio is not limited); solution concentration: 30mg / l.

[0046] Take out the cuvette (including the solution) first, and obtain the initial spectral intensity by detection, and the schematic diagram of the spectral intensity can be seen Figure 4 .

[0047] Put it into a cuvette (including ...

Embodiment 2

[0050] The equipment and components are the same as those in Embodiment 1.

[0051] Filter to be tested: 546nm (central wavelength) filter B to be tested.

[0052] Take out the cuvette (including the solution) first, and obtain the initial spectral intensity by detection, and the schematic diagram of the spectral intensity can be seen Figure 6 .

[0053] Put it into a cuvette (including solution), detect and measure the spectral intensity again, and the schematic diagram of the spectral intensity can be seen Figure 7 .

[0054] Compare the re-measured spectral intensity with the initial measured spectral intensity, and set the wavelength whose difference before and after the spectral intensity increases to 50cd is judged as a specific wavelength with obvious difference. There was no problem with the transmittance of sheet B at each wavelength, and the quality was good.

Embodiment 3

[0056] The equipment and components are the same as those in Embodiment 1.

[0057] Solution concentration: 50mg / l.

[0058] Take out the cuvette (containing the solution) first, and detect and obtain the initial spectral intensity.

[0059] Put it into a cuvette (containing solution), detect and measure the spectral intensity again.

[0060] Comparing the re-measured spectral intensity with the initial measured spectral intensity, it can be observed that the spectrum has more obvious absorption peaks (the difference in the diagram is not significant, and the diagram is not shown again, which can be used for reference Figure 5 ). It is still assumed that the wavelength with a difference of 50cd before and after the spectral intensity is judged to be a specific wavelength with obvious difference, then, there is still a problem with the transmittance of the filter A to be tested at the specific wavelength of 496-518nm.

[0061] In the existing experimental method, different ...

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Abstract

The invention relates to an optical filter cut-off depth detection method. The method comprises the steps of employing a light source, enabling a light beam emitted by the light source to pass througha to-be-detected optical filter, and receiving and displaying the initially-detected spectral intensity through spectral intensity detection equipment, placing a high-concentration solution between the to-be-detected optical filter and the spectral intensity detection equipment, so that a light beam emitted by the light source penetrates through the to-be-detected optical filter, then penetratesthrough the high-concentration solution, and is received and displayed by the spectral intensity detection equipment to re-detect the spectral intensity, and comparing the re-measured spectral intensity with the initially-measured spectral intensity, observing whether specific wavelengths with obvious difference in spectral intensity exist or not, and if the specific wavelengths with obvious difference in spectral intensity exist, judging that the transmittance of the to-be-measured optical filter on the specific wavelengths has a problem. By adopting a comparison mode, which specific wavelengths have absorption problems of the optical filter can be conveniently and quickly found out, and after the specific wavelengths are defined, analysis and improvement can be carried out in a more targeted manner, and design and manufacturing of the optical filter which is more perfect and high in quality can be guided.

Description

technical field [0001] The invention belongs to the technical field of optical property testing in physical testing, and in particular relates to a detection method for cut-off depth of an optical filter. Background technique [0002] Optical filter is a commonly used optical device, which is used to select the required radiation band, and is widely used in optical equipment, such as cameras, video cameras, etc. The cut-off depth is one of the parameters for judging the quality of the filter. The larger the cut-off depth OD of the filter, the smaller the transmittance and the lower the noise. The corresponding design and manufacture are more difficult, the requirements are higher, and the price is lower. More expensive. [0003] As for the detection of the cut-off depth of the optical filter, there is a test method disclosed in CN 103616163 A; in the usual project experiments, the Hamamatsu spectrometer and its supporting software are more often used. The terminal (usually...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01M11/02
CPCG01M11/02
Inventor 汤斌汪仁杰李奉笑陈庆周思寒赵明富胡新宇蒋上海吴德超钟年丙龙邹荣
Owner CHONGQING UNIV OF TECH