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Detection method of cut-off depth of optical filter

A technology of cut-off depth and detection method, applied in the direction of testing optical performance, etc., can solve problems such as inconvenience in transmittance detection, and achieve the effect of strong practicability, small error and high applicability

Active Publication Date: 2022-03-08
CHONGQING UNIV OF TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] Aiming at the above-mentioned deficiencies in the prior art, the technical problem to be solved by the present invention is to provide a cut-off depth detection method of an optical filter, to avoid the inconvenience of detecting the transmittance of some specific wavelengths of the optical filter, and to find out the filter depth conveniently. Which specific wavelengths the chip has absorption problems, so as to achieve the effect of easy judgment and feedback to improve quality

Method used

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  • Detection method of cut-off depth of optical filter
  • Detection method of cut-off depth of optical filter
  • Detection method of cut-off depth of optical filter

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0039] Light source: UV visible LED light source, can emit a portion of the near-UV beam and visible light beam of a portion of the band.

[0040] Optical fiber: UV-UV quartz fiber, wherein the light source wavelength ranges from 200 nm to 760 nm, numerical aperture Na = 0.26.

[0041] Color lens: fiber optic mirror, made of ultraviolet melt quartz.

[0042] Capacity: Adjustable filter clamp, the clamping range is 10-20 mm adjustable.

[0043] To be tested filter: 214 nm (center wavelength) filter A.

[0044] BC: Anti-UV isoprost.

[0045] Solution ingredient: The solvent is water, the solute is sodium oxalate and potassium permanganate (content ratio is not limited); solution concentration: 30 mg / L.

[0046] First take the cuvette (containing solution), detect the initial test spectral intensity, spectral intensity schematic visa Figure 4 .

[0047] Put into a cuvette (containing solution), detect the detection spectrum intensity, schematic view of the spectral intensity Figure...

Embodiment 2

[0050] Equipment and various components with embodiments.

[0051] To be tested filter: 546 nm (center wavelength) filter B.

[0052] First take the cuvette (containing solution), detect the initial test spectral intensity, spectral intensity schematic visa Image 6 .

[0053] Put into a cuvette (containing solution), detect the detection spectrum intensity, schematic view of the spectral intensity Figure 7 .

[0054] The reconstitulative spectral intensity is compared to the initial test spectral intensity, and the difference between the difference between the spectral intensity is increased to 50cd, that is, the specific wavelength of the significant difference is determined, and the observation comparison (which can be compared by the computer), to be tested filter The transmittance of the tablets in each wavelength does not have problems, and the quality is good.

Embodiment 3

[0056] Equipment and various components with embodiments.

[0057] Solution concentration: 50 mg / L.

[0058] The cuvette (containing solution) is taken first, and the initial test spectral intensity is obtained.

[0059] Put the cuvette (containing solution), the detection of the reconstructed spectrum strength.

[0060] The reconstitution spectrum intensity is compared to the initial test spectral intensity, and it can be observed that the spectrum has more obvious absorption peaks (the difference is not significant, no reproduction, can be drawn Figure 5 . Also, the wavelength of the growth difference between 50CD has a wavelength of 50 cd before and after the spectral intensity is judged, then the filtering of the filter A is still in a particular wavelength of 496 to 518 nm.

[0061] In the existing experimental method, different spectrometers and software can be used to determine the judgment of the present invention, such as Shanghai to share spectrometers and supporting s...

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Abstract

The invention relates to a method for detecting the cut-off depth of an optical filter, which includes a light source. After the light beam emitted by the light source passes through the optical filter to be tested, the spectral intensity detection device receives and displays the initially measured spectral intensity; A high-concentration solution is placed between the spectral intensity detection equipment, so that the light beam emitted by the light source passes through the filter to be tested, passes through the high-concentration solution, and is received and displayed by the spectral intensity detection equipment to measure the spectral intensity again; Then compare the measured spectral intensity with the initial measured spectral intensity, and observe whether there is a specific wavelength with obvious difference in spectral intensity. If there is a specific wavelength with obvious difference in spectral intensity, determine the transmission of the filter to be tested at the specific wavelength. rate is problematic. The invention adopts a comparison method, which can conveniently and quickly find out which specific wavelengths the optical filter has absorption problems. After the specific wavelength is clarified, it can be analyzed and improved in a more targeted manner, guiding the design and manufacture of more perfect, high-quality filter.

Description

Technical field [0001] The present invention belongs to the technical field of optical properties in a physical test, and more particularly to a cutoff depth detection method of a filter. Background technique [0002] The filter is a commonly used optical device for selecting the desired radiation band, which is widely used in optical devices such as cameras, cameras, and the like. The cutoff depth is one of the determination parameters of the quality of the color filter, the larger the cutoff depth OD of the filter, the smaller the transmittance, the smaller the noise, the corresponding design and manufacturing difficulty is also greater, the requirements are higher, the price is also More expensive. [0003] With regard to the detection of the cutoff depth of the filter, there is a test method disclosed in CN 103616163 A; in the usual project experiment, it is more commonly used to pass the detection signal to the installation of the detection signal when using the bunting spec...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01M11/02
CPCG01M11/02
Inventor 汤斌汪仁杰李奉笑陈庆周思寒赵明富胡新宇蒋上海吴德超钟年丙龙邹荣
Owner CHONGQING UNIV OF TECH