Divergent multi-line laser projection measurement simulation system and implementation method thereof
A multi-line laser and simulation system technology, applied in the field of structured light measurement, can solve the problems of increased difficulty in extracting the center of light fringes, great influence on the gray scale of light fringes, unfavorable measurement work, etc., and achieves low manufacturing cost, compact structure, and integrated high degree of effect
Active Publication Date: 2021-01-22
KUNMING UNIV OF SCI & TECH
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Problems solved by technology
[0005] During the actual on-site measurement, due to the interference of the harsh environment, the gray scale of the light fringe is greatly affected, the difficulty of extracting the center of the light fringe increases, and the reconstruction error also becomes larger, which is not conducive to the measurement work
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Embodiment 1
[0087] Embodiment 1: as Figure 1-10 As shown, a divergent multi-line laser projection measurement simulation system includes a three-dimensional measurement system structure composed of a reference plane, a camera, a laser, and an object to be measured; the object to be measured is placed at the center of the reference plane, and the camera is fixed on the front of the reference plane. At a certain height above, the optical axis of the camera is perpendicular to the reference plane, the laser is fixed on one side of the camera and projects the multi-line laser onto the reference plane and the object to be measured at a set inclination angle, and the corresponding light fringe image is collected by the camera; the laser is For divergent multi-line lasers, the number of light stripes can be adjusted arbitrarily. The default number of light stripes is set to 25. Each light stripe is calculated based on the Gaussian distribution function, and the angle between adjacent stripes is ...
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The invention discloses a divergent multi-line laser projection measurement simulation system and an implementation method thereof, and belongs to the technical field of structured light measurement.A three-dimensional measurement system structure suitable for the simulation system is as follows: a measured object is placed at the central position of a reference plane, the optical axis of a camera is perpendicular to the reference plane, and the camera is fixed at a specific height right above the reference plane; and a laser device is fixed on one side of the camera and projects the multi-line laser to the reference plane and the measured object at a certain inclination angle, and the camera is responsible for acquiring a corresponding light stripe image. The simulation system provided by the invention can simulate the divergent multi-line laser projection three-dimensional measurement system in a computer environment to obtain a result similar to that of field measurement; and the system simulation method provided by the invention can provide convenience for further error analysis and measurement system structure optimization of a later measurement system, and the simulation result has important guiding significance for on-site actual measurement work.
Description
technical field [0001] The invention discloses a divergent multi-line laser projection measurement simulation system and an implementation method thereof, which are designed based on a windows operating system platform and using C++builder6.0 software, and belong to the technical field of structured light measurement. Background technique [0002] With the rapid development of modern science and technology and the rapid improvement of manufacturing level, measurement technology has become an indispensable key technology in many research fields. Measurement efficiency, measurement method and measurement accuracy have become key indicators for evaluating measurement technology. Whether the measurement technology is advanced and efficient also determines the final product development quality to a certain extent. [0003] The projection grating method is a method for quickly and non-contactly obtaining the surface contour information of a three-dimensional object. After using a ...
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IPC IPC(8): G01B11/25G06F30/20
CPCG01B11/254G06F30/20
Inventor 李文国罗子欣侯大猛毛雪忆
Owner KUNMING UNIV OF SCI & TECH