Method for improving bursting of film layer, and film material
Patent Information
- Authority / Receiving Office
- CN · China
- Current Assignee / Owner
- JINAN JINGZHENG ELECTRONICS
- Publication Date
- 2021-01-22
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Abstract
Description
technical field
[0001] The present application belongs to the field of semiconductor element preparation, and in particular relates to a method and a thin film material for improving the bursting of a thin film layer. Background technique
[0002] Thin film wafers such as lithium niobate or lithium tantalate are widely used in nonlinear optics, ferroelectric, piezoelectric, etc. due to their high Curie temperature, strong spontaneous polarization, high electromechanical coupling coefficient, and excellent electro-optic effect , electro-optic and other fields. At present, the methods for preparing lithium niobate or lithium tantalate films mainly include epitaxial growth method, ion implantation and bonding separation method, ion implantation and grinding and polishing method.
[0003] Among them, the method for preparing the thin film by ion implantation and bonding separation method mainly includes the following steps: firstly, implanting ions into a thin film wafer such a...