The invention provides a method and equipment for
thinning a
lithium tantalate bonded
wafer, and relates to the technical field of
wafer thinning, initial
surface type data is detected firstly, then the inclination angle of a coarse
grinding wheel is adjusted according to the positive and negative values of the initial BOW value of the initial
surface type data, and then the
wafer is subjected to coarse
thinning. And then the rough
grinding surface type data of the thinned wafer are detected again, the inclination angle of the fine
grinding wheel is adjusted according to the positive and negative values of the rough grinding BOW value of the rough grinding surface type data, and then fine thinning is conducted on the wafer. Compared with the prior art, the wafer is thinned through rough thinning and fine thinning, the inclination angle of the
grinding wheel can be adjusted according to the BOW value before the thinning action, the
grinding wheel can be better matched with the wafer in the thinning process, on one hand, the risk of
brittle fracture such as edge breakage can be reduced, a subsurface damage layer can be slowed down, and therefore the service life of the
grinding wheel is prolonged; and on the other hand, the wafer can be adaptively corrected, and the problem of serious warping caused by thinning is solved. And the quality of the thinned ultrathin
lithium tantalate bonded wafer can be effectively improved.