Check patentability & draft patents in minutes with Patsnap Eureka AI!

Performance-controllable two-dimensional semiconductor transistor structure and production method thereof

A two-dimensional semiconductor and transistor technology, applied in semiconductor/solid-state device manufacturing, semiconductor devices, electrical components, etc., can solve problems such as difficult carriers and doping, achieve threshold voltage adjustment, broad application prospects, and solve electrical properties Difficult to adjust effect

Pending Publication Date: 2021-04-09
FUDAN UNIV
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The purpose of the present invention is to provide a two-dimensional semiconductor transistor structure with controllable performance and its preparation method, so as to solve the existing technical problem that the two-dimensional semiconductor material mentioned in the background technology is difficult to carry out carrier doping

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Performance-controllable two-dimensional semiconductor transistor structure and production method thereof
  • Performance-controllable two-dimensional semiconductor transistor structure and production method thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0035] Embodiments of the present invention are described in detail below, examples of which are shown in the drawings, wherein the same or similar reference numerals designate the same or similar materials or methods having the same or similar functions throughout. The embodiments described below by referring to the figures are exemplary only for explaining the present invention and should not be construed as limiting the present invention. In addition, various specific process and material examples are provided herein, but one of ordinary skill in the art will recognize the applicability of other processes and / or the use of other materials.

[0036] An embodiment of the present invention provides a two-dimensional semiconductor transistor structure with controllable performance, such as figure 1 As shown, it includes a stacked metal gate composed of a substrate 1, a two-dimensional semiconductor material 2 on the substrate, a source-drain metal electrode 3, a dielectric laye...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
Thicknessaaaaaaaaaa
Thicknessaaaaaaaaaa
Login to View More

Abstract

The invention belongs to the technical field of semiconductor devices, and particularly relates to a performance-controllable two-dimensional semiconductor transistor structure and a production method thereof. The structure comprises a substrate, a two-dimensional semiconductor material located on the substrate, a source-drain metal electrode, an oxide dielectric layer and a laminated metal gate located on the dielectric layer, wherein the oxide dielectric layer is a double-layer dielectric layer, and the laminated metal gate is a double-layer metal gate structure of bottom active metal and top inert metal. According to the invention, a double-layer dielectric layer is formed by utilizing a solid-phase diffusion reaction generated by direct contact of the bottom active metal and the oxide dielectric layer I, and the carrier concentration of the two-dimensional semiconductor material is accurately regulated and controlled by an electric dipole effect by controlling the thickness of the bottom active metal. According to the invention, the threshold voltage of the two-dimensional semiconductor field effect transistor can be adjusted, the switching ratio and the on-state current of the device are improved, and the structure has a wide application prospect in the manufacture of large-scale digital integrated circuits.

Description

technical field [0001] The invention belongs to the technical field of semiconductor devices, in particular to a two-dimensional semiconductor transistor structure with controllable performance and a preparation method thereof. Background technique [0002] Since the first discovery of graphene, two-dimensional semiconductor materials have attracted extensive attention due to their special layered structure and outstanding electrical properties. Two-dimensional semiconductor materials have a large bandgap range, which can not only overcome the short channel effect and quantum effect, maintain a good switching frequency, but also improve and enhance the performance of many existing electronic components. At present, the two-dimensional semiconductor materials prepared by mechanical exfoliation or chemical vapor deposition mainly include MoS 2 、MoTe 2 、WSe 2 、WS 2 , h-BN and black phosphorus, etc. Its good electrical and photoelectric properties are conducive to the prepa...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): H01L29/78H01L29/06H01L29/24H01L29/36H01L29/423H01L21/34H01L21/28
CPCH01L21/28008H01L29/0603H01L29/24H01L29/36H01L29/42364H01L29/42372H01L29/66969H01L29/78
Inventor 包文中马静怡郭晓娇童领陈新宇缑赛飞周鹏张卫
Owner FUDAN UNIV
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More