Multi-frequency-point dielectric constant measuring device based on stepped impedance resonance structure

Abstract

The invention relates to a multi-frequency-point dielectric constant measuring device based on a stepped impedance resonance structure. The measuring device comprises a first dielectric layer, a second dielectric layer and a third dielectric layer from top to bottom, and is characterized in that a first metal layer, a second metal layer and a third metal layer are etched on the lower surface of the first dielectric layer, a fourth metal layer is etched on the upper surface of the third dielectric layer, and a cavity filled with a tested material is arranged in the center of the second dielectric layer. According to the invention, signal lines with different widths are utilized to form microstrip lines with different impedances so as to form a stepped impedance resonance structure, the structure can generate a plurality of discrete resonance frequency points in a wide frequency band, and through electromagnetic parameters measured by a vector network analyzer and electromagnetic parameters simulated by electromagnetic simulation software HFSS, the dielectric constant of a measured material in the cavity of the measured solid or liquid or solid powder can be deduced, so that finally the multi-frequency-point dielectric constant measuring device based on the stepped impedance resonance structure is achieved.

Description

technical field [0001] The invention relates to a measuring device, in particular to a multi-frequency-point permittivity measuring device based on a ladder impedance resonance structure. Background technique [0002] The dielectric constant of a material is one of the most critical characteristics in the design of microwave radio frequency devices. However, the dielectric constant of the material will not remain constant with the change of the frequency, and the change of the dielectric constant of the material with the frequency will cause dispersion in the transmission line, resulting in pulse distortion in the ultra-wideband system. Therefore, a good understanding of the properties of broadband dielectric constant materials is required for accurate design of microwave radio frequency devices. [0003] The dielectric constant measurement methods of microwave frequency materials are mainly divided into resonance method and non-resonance method. Among the non-resonant met...

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Problems solved by technology

However, most of the non-resonant methods for testing the dielectric constant of materials can only measure the dielectric constant value at a certain frequency point, and cannot obtain the dielectric constant variation law of materials in a wide frequency band.

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