Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

A trench gate power device and method of making the same

A technology for power devices and trench gates, which is applied in semiconductor/solid-state device manufacturing, semiconductor devices, electrical components, etc., can solve the problems of difficult process control, high manufacturing cost, and decreased yield in the preparation of power semiconductor devices, and achieves a reduction in production. The effect of reducing the difficulty of process control, reducing the manufacturing cost and improving the yield

Active Publication Date: 2022-07-05
北京燕东微电子科技有限公司
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] In the embodiment of the present application, a trench gate power device and its preparation method are provided, which are used to solve the problems of difficult process control, reduced yield, and high manufacturing cost in the preparation of power semiconductor devices

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A trench gate power device and method of making the same
  • A trench gate power device and method of making the same
  • A trench gate power device and method of making the same

Examples

Experimental program
Comparison scheme
Effect test

preparation example Construction

[0048] In a first aspect, an embodiment of the present application provides a method for fabricating a trench gate power device, and the trench gate power device may specifically be a power device such as a MOSFET and an IGBT. The preparation method of the trench gate power device includes:

[0049] Step S11 , forming a trench gate MOS structure in the semiconductor substrate, the trench gate MOS structure includes: a body region extending from the surface of the semiconductor substrate into the semiconductor substrate; a first trench passing through the body region and extending into the semiconductor substrate A trench and a second trench, the width of the second trench is greater than the width of the first trench; a first insulating layer located on the surface of the body region; a second insulating layer located on the inner wall of the first trench; The third insulating layer; the first polysilicon filling the first trench, the surface of the first polysilicon is lower ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

Embodiments of the present application provide a trench gate power device and a method for fabricating the same. The method for fabricating the trench gate power device includes: forming a trench gate type MOS structure in a semiconductor substrate, the trench gate type MOS structure The structure includes a body region, a first trench, a second trench, a first insulating layer, a second insulating layer, a third insulating layer, a first polysilicon, a second polysilicon, a source region and a fourth insulating layer; depositing a stop layer and an interlayer dielectric layer in sequence; etching the interlayer dielectric layer, the stop layer and the first insulating layer to form a first contact hole; and etching the bottom of the first contact hole; and doping the surface of the body region around the first trench to form a contact region. With the solution in the present application, the lead-out of the electrodes can be realized by uniformly fabricating the conductive layer in the main unit area, thereby reducing the difficulty of process control, improving the yield and reducing the manufacturing cost.

Description

technical field [0001] The present application relates to the field of semiconductor technology, and in particular, to a trench gate power device and a preparation method thereof. Background technique [0002] Power semiconductor devices are the basic electronic components for energy conversion and control in power electronic systems. The continuous development of power electronics technology has opened up a wide range of application fields for power semiconductor devices. Power semiconductor devices marked by IGBT (Insulated Gate Bipolar Transistor, Insulated Gate Bipolar Transistor) and IGBT (Insulated Gate Bipolar Transistor) are the mainstream in the field of power electronic devices today. [0003] The gate structure of MOSFET and IGBT includes trench type and planar type. The trench gate is usually formed by growing a gate oxide layer on the sidewall of the trench and filling it with polysilicon. This gate structure improves the utilization efficiency of the plane are...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): H01L21/336H01L29/78H01L29/423
CPCH01L29/66628H01L29/78H01L29/4236
Inventor 周源方宇王超朱林迪常东旭梁维佳
Owner 北京燕东微电子科技有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products