Heterogeneous GeSn-based silicon-based deep groove protection PiN diode and production method thereof
A diode and deep groove technology, applied in the field of heterogeneous GeSn-based silicon-based deep groove protection PiN diodes and its preparation, can solve the disadvantages of silicon-based highly integrated reconfigurable antenna miniaturization, low power consumption, poor distribution uniformity, concentration Low-level problems, to achieve the effect of improving antenna system integration and stealth performance, good device performance, and improving low power consumption performance
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Embodiment 1
[0051] See figure 1 , figure 1 It is a flow chart of a method for preparing a heterogeneous GeSn-based silicon-based deep trench protected PiN diode according to an embodiment of the present invention. The method is suitable for preparing a heterogeneous GeSn-based silicon-based deep trench protected PiN diode, and the diode is mainly used for making silicon Base height integrated reconfigurable antenna. The method comprises the steps of:
[0052] (a) select a GeOI substrate, and dope in the GeOI substrate to form a top GeSn region;
[0053] (b) etching the GeSn region on the top layer of the substrate to form a deep groove in the active region;
[0054] (c) planarizing the sidewalls around the deep trench in the active region and using in-situ doping to form P and N regions;
[0055] (d) forming a GeSn alloy lead on the substrate to complete the preparation of the heterogeneous GeSn-based silicon-based deep groove protection PiN diode.
[0056] Wherein, for step (a), the...
Embodiment 2
[0093] See Figure 2a-Figure 2s , Figure 2a-Figure 2s It is a schematic diagram of a preparation method of a heterogeneous GeSn-based silicon-based deep groove protection PiN diode according to an embodiment of the present invention. On the basis of the above-mentioned embodiment 1, a heterogeneous GeSn-based silicon-based deep trench with a solid-state plasma region length of 80 microns is prepared. The groove protection PiN diode is taken as an example to describe in detail. The length of the solid-state plasma region can be between 50 microns and 150 microns. The specific steps are as follows:
[0094] S10, selecting a GeOI substrate.
[0095] See Figure 2a , the crystal orientation of the GeOI substrate 101 may be (100) or (110) or (111), without any limitation here. In addition, the doping type of the GeOI substrate 101 can be n-type or p-type, and the doping concentration is, for example, 0.5×10 14 ~1×10 15 cm -3 , the thickness of the top layer Ge is, for exampl...
Embodiment 3
[0133] Please refer to image 3 , image 3 It is a schematic diagram of a device structure of a heterogeneous GeSn-based silicon-based deep trench protection PiN diode according to an embodiment of the present invention. The heterogeneous GeSn-based silicon-based deep trench protection PiN diode adopts the above-mentioned figure 1 prepared as indicated. Specifically, the heterogeneous GeSn-based silicon-based deep groove protection PiN diode is prepared and formed on the GeOI substrate 301, and the P region 303, the N region 304 of the diode, and the local area between the P region 303 and the N region 304 in the lateral direction. The constitutive regions are located in the GeSn region 302 of the top layer of the GeOI substrate.
[0134] The present invention provides a heterogeneous GeSn-based silicon-based deep trench protection PiN diode. By introducing deep trench isolation technology and Si-GeSn-Si heterostructure, the low power consumption performance of the diode is...
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