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Multi-light field imaging method, electronic device and storage medium based on striped light source

An imaging method and multi-light field technology are applied in the field of electronic equipment and storage media, and multi-light field imaging to avoid mutual interference, reduce debugging difficulty and complexity, and improve detection efficiency.

Active Publication Date: 2021-08-31
苏州高视半导体技术有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] In order to overcome the problems existing in the related technologies, the present application provides a multi-light field imaging method based on a stripe light source, which can be applied to the detection of appearance defects of different materials. The imaging system composed of a light source and a line-scan camera can obtain detection images of multiple types of light fields, which reduces the difficulty and complexity of debugging the imaging system, avoids the problem of mutual interference between different imaging systems, and improves detection efficiency

Method used

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  • Multi-light field imaging method, electronic device and storage medium based on striped light source
  • Multi-light field imaging method, electronic device and storage medium based on striped light source
  • Multi-light field imaging method, electronic device and storage medium based on striped light source

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Embodiment 1

[0046]In order to continuously improve the efficiency and accuracy of product quality inspection, more and more industries are gradually choosing machine vision technology to replace manual inspection methods for product quality inspection. In the process of using machine vision technology to detect product appearance defects, due to the complexity of the product and the different detection requirements, multi-station detection is often required to meet the imaging detection of bright field, micro bright field and dark field, and multiple sets of light sources and The imaging system of the camera is used to meet the imaging requirements. The debugging of the imaging system is complicated and difficult, and there will be interference between different imaging systems. In the prior art, it is proposed to collect the image formed by the light emitted by the striped light source in different directions of light and dark changes through the glass to be tested, and detect the drastic...

Embodiment 2

[0069] In order to facilitate understanding, an embodiment of a multi-light field imaging method based on a stripe light source is provided below for illustration. In practical applications, vertical strobe and horizontal strobe will be performed on the light source irradiation light emitted by the stripe light source according to the strobe signal. To meet the detection requirements of different types and different directions of product appearance defects.

[0070] figure 2 It is a schematic flowchart of Embodiment 2 of the multi-light field imaging method based on the stripe light source shown in the embodiment of the present application.

[0071] see figure 2 , the second embodiment of the multi-light field imaging method based on the stripe light source shown in the embodiment of the present application includes:

[0072] 201. Adjust the reflected optical axis position of the line scan camera and the incident optical axis position of the stripe light source according t...

Embodiment 3

[0087] For ease of understanding, an example of a multi-light field imaging method based on stripe light sources is provided below for illustration. In practical applications, the first number of strobes of vertical strobe is controlled to be equal to the second number of strobes of horizontal strobe , and when the number of strobes reaches the preset number of strobes, the image cycle signal is output for splitting the multi-type light field images obtained by shooting, so that the number of image cycles corresponding to each detection position has the same number as the preset number of strobes Consistent inspection images to meet the inspection needs of each inspection location.

[0088] image 3 It is a schematic flowchart of Embodiment 3 of the multi-light field imaging method based on the stripe light source shown in the embodiment of the present application.

[0089] see image 3 , the third embodiment of the multi-light field imaging method based on the stripe light ...

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Abstract

This application is about a multi-light field imaging method based on stripe light sources. The method includes: determining the installation position of the line-scan camera; adjusting the reflective optical axis position of the line-scan camera and the incident optical axis position of the stripe light source according to the navigation information of the navigation sensor; obtaining the stroboscopic signal and the shooting frequency signal sent by the stroboscopic controller ;According to the stroboscopic signal, the irradiated light of the light source emitted by the stripe light source is stroboscopically obtained to obtain the stripe light; the stripe light is irradiated on the surface of the product to be tested; according to the shooting frequency signal, the line-scan camera is controlled to shoot successively at each detection position of the product to be tested , to get multi-type light field images. The solution provided by this application can be applied to the detection of appearance defects of different materials. Through an imaging system composed of a stripe light source and a line-scan camera, detection images of various types of light fields can be obtained, which reduces the difficulty and complexity of debugging the imaging system. To a certain extent, the mutual interference between different imaging systems is avoided, and the detection efficiency is improved.

Description

technical field [0001] The present application relates to the technical field of image detection, and in particular to a multi-light field imaging method based on a stripe light source, an electronic device and a storage medium. Background technique [0002] In order to continuously improve the efficiency and accuracy of product quality inspection, more and more industries are gradually choosing machine vision technology to replace manual inspection methods for product quality inspection. In the process of using machine vision technology to detect product appearance defects, due to the complexity of the product and the different detection requirements, multi-station detection is often required to meet the imaging detection of bright field, micro bright field and dark field, and multiple sets of light sources and The imaging system of the camera is used to meet the imaging requirements. The debugging of the imaging system is complicated and difficult, and there will be interf...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/88G01N21/01H04N5/04H04N5/232
CPCG01N21/8806G01N21/8851G01N21/01H04N5/04G01N2021/8887H04N23/60
Inventor 周波邹伟金李良湾
Owner 苏州高视半导体技术有限公司