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Preparation method of long-arm probe of atomic force microscope

An atomic force microscope and probe technology, applied in scanning probe technology, scanning probe microscopy, instruments, etc., can solve problems such as cumbersome operation process, and achieve the effects of simple and fast operation, reduced preparation cost, and strong practicability

Active Publication Date: 2021-08-17
DALIAN MARITIME UNIVERSITY
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] According to the above mentioned existing preparation method, there are technical problems that the operation process is cumbersome and has high requirements for operators, and an atomic force microscope long-arm probe is provided. needle preparation method

Method used

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  • Preparation method of long-arm probe of atomic force microscope
  • Preparation method of long-arm probe of atomic force microscope
  • Preparation method of long-arm probe of atomic force microscope

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preparation example Construction

[0043] like Figure 1-4 As shown, the present invention provides a kind of preparation method of atomic force microscope long-arm probe, and the preparation method step comprises:

[0044] Step S1: fixing the microrod 6;

[0045] Step S2: preparation of microgel droplets;

[0046] Step S3: making the probe;

[0047] The step S1: the fixing of the microrod 6 includes:

[0048] 1) making the microrod 6, using a microelectrode wire drawing instrument to draw the glass rod 1 into a filamentous microrod 6;

[0049] 2) After successful drawing, the glass rod 1 is cut from the middle, and divided into two parts, glass rod A3 and glass rod B7;

[0050] 3) Clamp the microrod 6 on the glass rod A3 part with clean tweezers 5, and use the electrostatic adhesion between the tweezers 5 and the microrod 6 to vertically fix the microrod 6 on the end of the tweezers 5;

[0051] 4) Place the tweezers 5 that have intercepted the microrod 6 on the pre-prepared support for use;

[0052] The ...

Embodiment 1

[0063] like Figure 1-4 A preparation method for an atomic force microscope long-arm probe is shown, comprising the following steps:

[0064] Phase 1: Fixation of the microrod

[0065] 1) Making microrods, this time we made glass microrods with a diameter of 5 microns. Using a microelectrode wire drawing instrument, draw a glass rod with a diameter of 1 mm into a filamentous microrod with a diameter of 5 microns;

[0066] 2) After successful drawing, cut the glass rod from the middle and divide it into two parts, A and B;

[0067] 3) Use clean tweezers to pick up the microrod (30 microns in length) on part A, and use the electrostatic adhesion between the tweezers and the microrod to vertically fix the microrod on the end of the tweezers;

[0068] 4) Put the tweezers that have cut off the micro-rod on the pre-prepared bracket for use;

[0069] Stage 2: Microdroplet Preparation

[0070] 5) Take a certain amount of UV curing glue and drop it on a clean glass sheet;

[0071...

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Abstract

The invention provides a preparation method of a long-arm probe of an atomic force microscope, which comprises the following steps: firstly, drawing a size-controllable micro-rod by using a microelectrode drawing instrument, and vertically fixing the micro-rod at the tail end of tweezers by using adhesive force; then, dipping the prepared ultraviolet curing glue by using the rest of the micro-rods, and forming micron-sized ultraviolet curing glue liquid drops at the tail ends of the micro-rods by virtue of a surface tension effect; finally, fully utilizing an optical imaging system and a motion control system of the atomic force microscope, adhering ultraviolet curing glue to the tail end of the cantilever, enabling the micro rods and the cantilever to be tightly adhered, and completing preparation of the probe. The preparation process of the long-arm probe of the atomic force microscope is greatly simplified, operation is easy, convenient and rapid, and the practicability is high. The method can be carried out in a relatively simple experiment environment, and a high-precision three-dimensional micro-motion platform is not needed, so that the preparation cost of the method is reduced to a great extent.

Description

technical field [0001] The invention relates to the field of atomic force microscope application technology, in particular to a method for preparing a long-arm probe of an atomic force microscope. Background technique [0002] Atomic force microscopy (AFM) is an instrument that can obtain two-dimensional and three-dimensional images of the material surface and the surface morphology of the three-dimensional size of the particles by scanning the surface of the sample. During the detection process, one end of the probe cantilever is fixed, and the other end decorated with a needle tip is used to approach the sample. The cantilever is deformed or changes its motion state under the influence of the force between the needle tip and the sample. With the deepening of the research, recently, the atomic force microscope is often used to detect the very weak force between the sample surface and the probe to study the surface structure and properties of the material. For example, the v...

Claims

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Application Information

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IPC IPC(8): G01Q70/16
CPCG01Q70/16
Inventor 刘志坚吴天泽武森隋卓航王峰范子笑潘新祥
Owner DALIAN MARITIME UNIVERSITY