Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Wafer packaging method and packaging structure

A wafer packaging and packaging layer technology, which is applied in the manufacturing of electrical components, electric solid-state devices, semiconductor/solid-state devices, etc., can solve the problems of large volume and thickness of packaging structures, being easily affected by external magnetic fields, and complex packaging methods. Achieve good process compatibility, good insulation effect, and simplify the packaging method.

Pending Publication Date: 2021-10-22
芯知微(上海)电子科技有限公司
View PDF4 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

For example: the physical connection between the chip to be integrated and the wafer is realized by bonding technology, the electrical connection between semiconductor devices is realized by electroplating technology, and the chip to be integrated is realized by through-silicon via (TSV) and electroplating technology The electrical connection with other circuits, the packaging method is relatively complicated; and the chip to be integrated is easily affected by the external magnetic field during the use of the packaging structure, resulting in the problem of unstable performance. Therefore, in the packaging process, usually The interference of the external magnetic field is reduced by setting a shielding structure in the packaging structure, but the packaging structure with shielding function has the problem of large volume and thickness

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Wafer packaging method and packaging structure
  • Wafer packaging method and packaging structure
  • Wafer packaging method and packaging structure

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0035] Embodiment 1 provides a wafer packaging method, comprising the following steps:

[0036] S01: Provide a device wafer, in which a plurality of first chips are formed, and first electrodes are formed on the first chips;

[0037] S02: Forming a first dielectric layer and a first conductive bump on the device wafer, the first dielectric layer and the first conductive bump being flush with the surface on a side away from the first chip;

[0038] S03: providing a plurality of second chips, on which second electrodes are formed;

[0039] S04: forming a second dielectric layer and a second conductive bump on the second chip, where the second dielectric layer and the second conductive bump are flush with the surface on a side away from the second chip;

[0040] S05: Bond the second dielectric layer to the first dielectric layer, and align and bond the second conductive bump to the first conductive bump, so that the second chip is bonded to the on the device wafer;

[0041] S0...

Embodiment 2

[0079] This embodiment provides a wafer packaging structure, Figure 13 It shows a schematic cross-sectional structure diagram of a wafer packaging structure in Embodiment 2, please refer to Figure 13 , the wafer package structure, comprising:

[0080] A device wafer 100, wherein a plurality of first chips 101 are formed in the device wafer 100, and first electrodes 102 are formed on the surface of the first chips 101;

[0081] a first conductive bump 104, disposed on the first electrode 102;

[0082] The first dielectric layer 103 is formed on the first chip 101, the side surface of the first dielectric layer 103 away from the first chip 101 and the first conductive bump 104 away from the first chip 101 one side of the surface is flush;

[0083] a second chip 202, on which a second electrode 203 is formed;

[0084] a second conductive bump 205, the second conductive bump 205 is disposed on the second electrode 203, and the second conductive bump 205 is bonded to the firs...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
thicknessaaaaaaaaaa
thicknessaaaaaaaaaa
thicknessaaaaaaaaaa
Login to View More

Abstract

The invention provides a wafer packaging method and packaging structure. The method comprises the steps of: providing a device wafer, forming a plurality of first chips in the device wafer, and forming first electrodes on the first chips; forming first dielectric layers and first conductive bumps on the device wafer, the surfaces of the sides, far away from the first chips, of the first dielectric layers and the first conductive bumps being flush; forming second electrodes on second chips; forming second dielectric layers and second conductive bumps on the second chips, the surfaces of the sides, far away from the second chips, of the second dielectric layers and the second conductive bumps being flush; aligning and bonding the second dielectric layers and the first dielectric layers as well as the second conductive bumps and the first conductive bumps; forming an insulating layer covering the first dielectric layer, the second chips, and the second dielectric layers, the second electrodes and the second conductive bumps exposed out of the second chips in a shape-preserving manner; covering the insulating layer with a shielding layer in a shape-preserving manner; and forming a packaging layer on the shielding layer. According to the invention, the packaging method is simplified, and the size of the formed packaging structure is reduced.

Description

technical field [0001] The invention relates to the technical field of semiconductors, in particular to a wafer packaging method and a packaging structure. Background technique [0002] System-in-Package Sip (System in Package) can combine multiple active components with different functions, as well as other components such as passive components, micro-electromechanical systems (MEMS), and optical components, into one unit to form a multi- Functional systems or subsystems that allow integration of heterogeneous ICs. It effectively solves the problem that SOC (system-on-chip) cannot integrate analog, radio frequency and digital functions. System-in-package SiP integration is relatively simple, the design cycle and market cycle are shorter, the cost is lower, and more complex systems can be realized. [0003] WLP mainly includes two important processes of physical connection and electrical connection. For example: the physical connection between the chip to be integrated an...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H01L21/50H01L21/56H01L21/603H01L23/31H01L23/488H01L23/552
CPCH01L21/50H01L21/56H01L24/81H01L23/488H01L23/3114H01L23/552H01L2224/81203
Inventor 蔺光磊
Owner 芯知微(上海)电子科技有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products