Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Breeding method for improving wheat scab resistance by using scab-resistant germplasm SF7EL9

A technology for wheat scab and scab, which is applied in the fields of plant genetic improvement, botanical equipment and methods, and applications, can solve the problems of unremarkable agronomic traits and have not been directly applied, and improve the resistance to scab. , the effect of genetic stability

Inactive Publication Date: 2021-11-02
YANGZHOU UNIV
View PDF2 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the materials are all whole-arm translocation lines, and their agronomic characteristics are not outstanding, so they have not been directly applied in breeding

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Breeding method for improving wheat scab resistance by using scab-resistant germplasm SF7EL9
  • Breeding method for improving wheat scab resistance by using scab-resistant germplasm SF7EL9
  • Breeding method for improving wheat scab resistance by using scab-resistant germplasm SF7EL9

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0032] In order to understand the effect of the small fragment translocation line SF7EL9 on resistance to head blight and to clarify its utilization value, SF7EL9 was used as the male parent and the susceptible variety Annong 8455 was used as the female parent, and then Annong 8455 was used as the female parent to backcross for one generation. Selfing, identified by molecular marker Th7EL-46 and genomic fluorescence in situ hybridization (GISH) ( Figure 4 ) to obtain improved germplasm. After years of scab resistance identification, it was found that the obtained new germplasm was highly resistant to scab ( Figure 5 ).

Embodiment 2

[0034] SF7EL9 was used as one of the parents (male or female) to cross with the high-yield variety Yangmai 23. First, SF7EL9 was crossed with Yangmai 23, F 1 Daizai backcrossed Yangmai 23 and got BC 1 f 1 Seed, single plant BC 1 f 1 , using the molecular marker Th7EL-46 to select at the seedling stage, keeping plants containing the Th7EL-46 marker and harvesting individually to obtain BC 1 f 2 Seeds; planted in individual plants BC 1 f 2 , 6 rows per plant, 5 plants per row, each individual plant was selected using molecular markers and GISH, and the individual plants containing Th7EL-46 marker plants and E. elongatum chromosomes were kept, and at the flowering stage, single plants were used Identification of scab resistance by flower infusion method, harvesting plants with good scab resistance from a single plant to obtain BC 1 f 3 Seeds; planted in individual plants BC 1 f 3 , 6 rows per plant, 5 plants per row, each individual plant was selected using molecular m...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a breeding method for improving wheat scab resistance by using scab-resistant germplasm SF7EL9. One 7EL specific molecular marker Th7EL-46 can effectively identify whether a 7EL chromosome segment of elytrigia elongata is contained or not, so that molecular marker-assisted selective breeding is facilitated; after a product amplified by the marker is subjected to gel electrophoresis, a 450bp band is a 7EL chromosome segment specific band; in addition, the translocation chromosomes are homozygous or heterozygous can be effectively distinguished by combining fluorescence in-situ hybridization identification, and if only one translocation chromosome is contained, the material is a heterozygous translocation line; and if two translocation chromosomes with the same FISH karyotype are contained, the material is a homozygous translocation line. The method mainly comprises the characteristics that through a distant hybridization means, a scab-resistant wheat-elytrigia elongata 7EL small fragment translocation line SF7EL9 is hybridized with cultivated wheat, and scab-resistant wheat germplasm is bred from filial generations. The Th7E-46 can be used as a biomarker to be applied to real-time identification of the elytrigia elongata 7EL chromosome segment contained in the disease-resistant germplasm.

Description

technical field [0001] The invention relates to a breeding method for improving wheat scab resistance by utilizing the scab-resistant germplasm SF7EL9, belonging to the technical field of plant breeding. Background technique [0002] Fusarium head blight (FHB) is a major worldwide disease caused by pathogens such as Fusarium asiaticum and Fusarium graminearium, which seriously affects the yield and quality of wheat. After wheat is infected with head blight, in addition to causing a significant decrease in yield, it also accumulates toxin-deoxynivalenol (DON) in the grain, which brings great hidden dangers to food safety. With global warming and changes in farming systems and methods, the occurrence area of ​​wheat scab in my country has been expanding. From 2005 to 2010, the average annual occurrence area of ​​wheat scab was about 61.96 million mu. The occurrence area increased to 86.32 million mu, and the occurrence area increased to about 90 million mu in 2019-2020. How t...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): A01H1/02A01H1/04
CPCA01H1/021A01H1/04
Inventor 戴毅陈建民李海凤石俊涛高勇
Owner YANGZHOU UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com