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Pulse X-ray diode for measuring spatial distribution characteristics of material

A space distribution, diode technology, applied in X-ray tubes, X-ray tube electrodes, X-ray tube components, etc., to achieve the effects of increasing the output ratio, improving environmental adaptability, and improving sensitivity

Pending Publication Date: 2021-11-19
INST OF FLUID PHYSICS CHINA ACAD OF ENG PHYSICS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Based on the test requirements for the spatial distribution characteristics of some low-density materials, a pulse-type diode with low energy, high strength, convenient movement, low cost, and strong environmental adaptability is required, and the traditional structure of the diode does not meet the requirements.

Method used

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  • Pulse X-ray diode for measuring spatial distribution characteristics of material
  • Pulse X-ray diode for measuring spatial distribution characteristics of material
  • Pulse X-ray diode for measuring spatial distribution characteristics of material

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0043] Such as Figure 1-Figure 5 As shown, a pulsed X-ray diode used for measuring the spatial distribution characteristics of materials includes an air-filled sealing flange 1, a diode tube 2, an insulating tube 6, a diode case 8, an anode assembly, a cathode assembly and a vacuum cover 9;

[0044] The insulating cylinder 6 is a convex structure whose outer wall is large at one end and small at the other end, the diode tube 2 is arranged outside the large end of the convex structure, and the diode case 8 is arranged outside the small end of the convex structure;

[0045] The cathode assembly is installed on the end of the diode casing 8 away from the large end of the convex structure through the cathode disc crimping flange 10, and the vacuum cover plate 9 is arranged on the end of the diode casing 8 away from the large end of the convex structure. A vacuum target chamber is formed between the diode case 8, the vacuum cover plate 9 and the insulating cylinder 6, and the vacuum...

Embodiment 2

[0071] This embodiment is based on Embodiment 1. The outer walls of the diode tube 2 and the diode case 8 are provided with fixing hoops 3 , and the pulsed X-ray diode is detachably connected to the fixing base 4 through the fixing hoops 3 during use.

[0072] Specifically, the cylinder of the pulsed X-ray diode is placed on the two semicircular supports attached to the fixed base 4, and the fixed hoop 3 and the fixed base 4 are locked with screws.

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Abstract

The invention discloses a pulse X-ray diode for measuring spatial distribution characteristics of a material. The pulse X-ray diode comprises an inflatable sealing flange, a diode tube cylinder, an insulating cylinder, a diode tube shell, an anode assembly, a cathode assembly and a vacuum cover plate, wherein the insulating cylinder is of a convex structure, the diode tube cylinder is arranged on the outer side of the large end of the convex structure, and the diode tube shell is arranged on the outer side of the small end of the convex structure. The inflatable sealing flange is arranged at the end, away from the small end of the convex structure, of the diode tube cylinder, a center through hole is formed in the insulating cylinder in the axial direction, and a high-pressure connecting piece is arranged on the side, close to the small end of the convex structure, in the center through hole. When the pulse X-ray diode is used, the high-voltage cable is connected with the diode, pulse high voltage is transmitted to the vacuum discharge cavity through the insulating part, the cathode generates electron beams to bombard the anode target, finally, pulse X-rays are radiated outwards through the light emitting window, and the pulse X-ray diode has the advantages of being low in energy, high in strength, convenient to move, low in cost and high in environmental adaptability.

Description

technical field [0001] The invention relates to the technical field of pulsed X-ray generation, in particular to a pulsed X-ray diode used for measuring spatial distribution characteristics of materials. Background technique [0002] The electron beam with a certain energy bombards the target. When the electrons collide with the target atoms inelastically, their speed and direction will change, and electromagnetic radiation will be generated. This physical process is called bremsstrahlung. At the same time, when the energy of the electrons is greater than a certain threshold, the electrons in the shell of the target atom may be knocked out, and the electrons in the shell will transition to fill and generate photons with energy differences between the two orbits. This physical process is called characteristic radiation. Generally, the X-rays generated after the electron beam bombards the target have a broad spectrum that contains both bremsstrahlung and characteristic radiati...

Claims

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Application Information

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IPC IPC(8): H01J35/16H01J35/00H01J35/04
CPCH01J35/16H01J35/00H01J35/04
Inventor 邓明海马成刚莫腾富马勋袁建强任国武张绍龙陈永涛
Owner INST OF FLUID PHYSICS CHINA ACAD OF ENG PHYSICS
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