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Processing and analyzing system and method of mass spectrum device

An analysis system and analysis method technology, applied in the field of mass spectrometry devices, can solve problems such as low vacuum degree, time-of-flight error, and large resistance

Pending Publication Date: 2021-12-03
深圳泰莱生物科技有限公司 +1
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  • Abstract
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  • Claims
  • Application Information

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Problems solved by technology

For this reason, an object of the present invention is to propose a processing and analysis system and method for a mass spectrometer, which solves the problems that the mass spectrometer cannot efficiently ionize the sample, the low vacuum leads to large resistance, and there is an error in the flight time.

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  • Processing and analyzing system and method of mass spectrum device
  • Processing and analyzing system and method of mass spectrum device
  • Processing and analyzing system and method of mass spectrum device

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Embodiment Construction

[0028] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention.

[0029] A processing and analysis system for a mass spectrometry device proposed by the present invention includes a sample introduction system, a sample ionization system, an ion detector, a data acquisition card, a control board 7 and analysis software;

[0030] The sampling system includes a sampling cavity 1 and a main cavity, the sample cavity is provided with a sample target, and the sample target can be moved into the main cavity in a controllable manner;

[0031] The sample ionization system includes a vacuum system and an ion source 2, the vacuum system evacuates the vacuum area, the ion source 2 breaks up the sample with a high-pulse laser and accelerates the...

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Abstract

The invention discloses a processing and analyzing system of a mass spectrum device. The processing and analyzing system comprises a sample injection system, a sample ionization system, an ion detector, a data acquisition card, a control panel and analysis software, the sample injection system comprises a sample injection cavity and a main body cavity, and a sample target is arranged at the position of the sample cavity; the sample ionization system comprises a vacuum system and an ion source, and the vacuum system is used for vacuumizing a vacuum area; the ion detector is used for detecting flight time of ions with different mass-to-charge ratios; the data acquisition card is used for acquiring and converting an electric signal output by the ion detector and transmitting the electric signal to the control panel; the analysis software is installed on a processor, and the processor receives data transmitted by the control panel and analyzes the data through the analysis software. According to the vacuum system, the pressure intensity in a vacuum area can reach 3*10<-4> Pa or below, under high-pulse laser irradiation, a sample is effectively ionized, the detection limit reaches 1 fmol / ul, and the quality detection accuracy is as follows: the precision of an internal standard method is 150 ppm, and the precision of an external standard method is 200 ppm.

Description

technical field [0001] The invention relates to the technical field of mass spectrometry devices, in particular to a processing and analysis system and method for mass spectrometry devices. Background technique [0002] The time-of-flight mass analyzer can analyze the mass of charged ions with a certain flight speed generated by the ion source. The time-of-flight mass analyzer is a field-free flight tube. When the ion source ionizes the sample into charged ions, the ions with different mass-to-charge ratios enter the flight tube at different speeds by accelerating the electric field. The larger the mass-to-charge ratio, the lower the speed. Ions with different flight speeds fly in the flight tube with the same length, so the time to reach the detector is also different. Ions with a small mass-to-charge ratio arrive first, and ions with a large mass-to-charge ratio arrive later, thereby completing mass analysis. However, the current time-of-flight mass analyzer will have low...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01J49/40H01J49/00H01J49/02H01J49/04H01J49/06H01J49/24G01N27/64
CPCH01J49/40H01J49/02H01J49/04H01J49/24H01J49/067H01J49/0031G01N27/64
Inventor 郑杰何浩睿钟晟刘佳派吴小亮夏文君刘彬
Owner 深圳泰莱生物科技有限公司
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