Manufacturing method of shield gate MOSFET device
A manufacturing method and shielding grid technology, applied in semiconductor/solid-state device manufacturing, semiconductor devices, electrical components, etc., to achieve the effect of reducing manufacturing costs
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[0042] The present invention will be described in detail below in conjunction with the accompanying drawings and embodiments. It should be pointed out that in the following description of the shielded gate trench field effect transistor device and its manufacturing method of the present invention, the semiconductor substrate of the shielded gate trench field effect transistor device is considered to be made of silicon (Si) material. However, the substrate can also be made of any other material suitable for the manufacture of shielded gate trench field effect transistors, such as gallium nitride (GaN), silicon carbide (SiC) and so on. In the following description, the conductivity type of the semiconductor region is divided into P-type (second conductivity type) and N-type (first conductivity type), and a P-type conductivity type semiconductor region can be obtained by doping one or Composed of several impurities, these impurities can be but not limited to: boron (B), aluminum ...
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