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Wide-field optical slice rapid imaging method based on virtual HiLo algorithm

A technology of optical sectioning and imaging method, applied in the direction of 2D image generation, calculation, image enhancement, etc., can solve the problems of complex experimental setup, slow imaging speed, existence of artifacts, etc., to achieve suppression of artifacts, high signal-to-noise ratio, The effect of reducing the cost of experiments

Pending Publication Date: 2022-02-01
SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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Problems solved by technology

[0007] The purpose of the present invention is to provide a fast imaging method for wide-field optical slices based on virtual HiLo algorithm, that is, V-HiLo-ED (Virtual HiLo based on edgedetection), which overcomes the existing optical The slicing method has problems such as slow imaging speed, high cost, complicated experimental equipment, and artifacts

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  • Wide-field optical slice rapid imaging method based on virtual HiLo algorithm
  • Wide-field optical slice rapid imaging method based on virtual HiLo algorithm
  • Wide-field optical slice rapid imaging method based on virtual HiLo algorithm

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Embodiment Construction

[0047] The technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention. It should be understood that the Laplacian (LOG) in the edge detection described here is only used for The present invention is explained, not intended to limit the present invention.

[0048] refer to figure 1 As shown, the present invention exemplifies a wide-field imaging system for V-HiLo-ED, which uses a green incoherent light source LED with an optical fiber as the illumination source to perform original wide-field imaging and the proposed V- HiLo-ED method imaging. After the LED is converged by the lens 1, it is diverged by the lens 2 to become non-collimated light. It is only necessary to ensure that the light beam can be irradiated on the object 1 and the object 2 at the same time, and is not blocked by the aperture of the lens 3. Then the lens 3 is converg...

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Abstract

The invention belongs to the field of optical imaging, particularly belongs to the field of optical slice imaging, and provides a wide-field optical slice rapid imaging method based on a virtual HiLo algorithm. The method comprises the following steps of carrying out edge detection on an original image, and realizing a virtual HiLo algorithm process in combination with a widely applied HiLo algorithm. The method has the optical slice performance comparable with that of a conventional optical slice imaging technology. The method is characterized in that only one wide-field illumination image is needed to reconstruct the optical slice image, and compared with a conventional optical slice method, the method can effectively improve the imaging speed, suppress motion artifacts, simplify the imaging complexity and reduce the cost of an imaging device. In addition, the method can be easily applied to the imaging field with defocus fuzzy noise suppression related requirements.

Description

technical field [0001] The invention belongs to the field of optical imaging, more specifically, the field of optical slice imaging. Involving edge detection, combined with HiLo algorithm, a low-cost, fast imaging method for wide-field optical slices based on virtual HiLo algorithm is proposed. [0002] technical background [0003] Wide-field imaging is a basic imaging modality among optical imaging methods and is popular because of its high speed and low cost. But some common disadvantages are also obvious. When observing objects with depth, the out-of-focus signal is blurred into the background or noise, and the excitation of additional illumination light may reduce the signal-to-noise ratio of the acquired image. This hinders the acquisition of high-contrast images. To suppress this out-of-focus noise, various optical sectioning imaging techniques have been developed, such as confocal fluorescence microscopy, two-photon fluorescence microscopy, light-sheet fluorescence ...

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Application Information

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IPC IPC(8): G06T11/00G06T5/00
CPCG06T11/001G06T2207/20056G06T2207/20024G06T5/70
Inventor 刘军胡渝曜梁东宣雅萍
Owner SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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