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Microscope observation stage and use method thereof

A microscope and stage technology, which is applied in the direction of microscope, test sample preparation, discharge tube, etc., can solve the problems that affect the adsorption of sample particles, cannot ensure that the sample liquid is completely dried, and cross-contamination, so as to reduce the probability of cross-contamination , The effect of reducing the number of clamping substrates

Pending Publication Date: 2022-05-13
邑流微测股份有限公司
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Problems solved by technology

[0003] However, in the above-mentioned method, when the substrate is covered on the sample liquid, the surface tension of the sample liquid makes the substrate slide and affects its adsorption of the sample particles, and the contact with the substrate surface when the substrate surface is wiped is also will affect its adsorption of sample particles
In addition, the above method cannot ensure that the sample liquid on the surface of the substrate is completely wiped dry, resulting in cross-contamination in the subsequent washing process, and the above-mentioned method needs to use clips to clamp the substrate many times, which will also cause cross-contamination

Method used

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  • Microscope observation stage and use method thereof
  • Microscope observation stage and use method thereof
  • Microscope observation stage and use method thereof

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Embodiment Construction

[0020] Reference will now be made in detail to exemplary embodiments of the present invention, examples of exemplary embodiments are illustrated in the accompanying drawings. Whenever possible, the same component symbols are used in schemas and descriptions to represent the same or similar parts.

[0021] Figure 1 Is an embodiment of the present invention is a block diagram of a microscope observation stage. Figures 2A through 2F Illustrated Figure 1 The operation of the microscope observation stage. Figure 3 Illustrated Figure 2A The sample particles in the droplets are adsorbed by the substrate, which is schematically plotted Figure 2A A local enlargement of the substrate. Please refer to Figure 1 、 Figure 2A and Figure 3 , the microscope observation stage 100 of the present embodiment includes a rotating seat 110 and a drive unit 120. The rotating seat 110 is suitable for carrying the substrate 50 by its bearing surface 110a, the substrate 50 is suitable for bearing droplets ...

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Abstract

The invention provides a microscope observation platform deck which comprises a rotating seat and a driving unit. The rotating seat is suitable for bearing a base material, the base material is suitable for bearing a liquid drop, and the liquid drop comprises sample liquid and at least one sample particle suspended in the sample liquid. The driving unit is connected to the rotating seat and is suitable for driving the rotating seat to rotate so as to remove the sample liquid on the base material through centrifugal force generated by rotation of the rotating seat. In addition, the invention also provides a use method of the microscope observation stage. According to the microscope observation stage and the use method thereof, the sample particles can be really adsorbed on the surface of the base material, and the probability of cross contamination on the surface of the base material can be reduced.

Description

Technical field [0001] The present invention relates to an observation stage, and in particular to a microscope observation stage. Background [0002] A common electron microscopy observation method is to first drop the sample liquid containing sample particles on a clean surface in a dropper or other way, and then cover the substrate on this sample solution so that the sample particles are adsorbed on the substrate surface. Then, after the sample liquid on the surface of the substrate is wiped dry, the residue on the surface of the substrate is washed with clean water and the clean water on the substrate is wiped dry, so that the sample particles on the substrate can be observed by electron microscopy. [0003] However, in the above-described embodiment, when the substrate is covered on the sample liquid, the surface tension of the sample liquid causes the substrate to slide and affect its adsorption of the sample particles, and the contact with the substrate surface when dryin...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N1/28H01J37/20H01J37/26G02B21/26G02B21/34
CPCG01N1/28H01J37/20H01J37/261G02B21/26G02B21/34G02B27/0006
Inventor 赖良训李信宏
Owner 邑流微测股份有限公司
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