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Semiconductor structure and forming method thereof

A technology for semiconductors and stack structures, used in semiconductor/solid-state device manufacturing, transistors, electrical components, etc.

Pending Publication Date: 2022-07-01
SEMICON MFG INT (SHANGHAI) CORP +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] However, forming vertically stacked complementary field-effect transistors presents unique challenges

Method used

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  • Semiconductor structure and forming method thereof
  • Semiconductor structure and forming method thereof
  • Semiconductor structure and forming method thereof

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Embodiment Construction

[0056] As is known from the background art, how to form vertically stacked complementary field effect transistors presents unique challenges.

[0057] In order to solve the above problem, an embodiment of the present invention provides a method for forming a semiconductor structure, the method includes: providing a substrate with discrete fin stack structures on the substrate; the fin stack structures include a first a sacrificial material layer, a first fin layer on the first sacrificial material layer, a second sacrificial material layer on the first fin layer, and a second fin layer on the second sacrificial material layer; forming a gate structure across the fin stack structure on the substrate; etching the fin stack structure with the gate structure as a mask until the top surface of the first fin layer is exposed , forming a second fin and a second sacrificial layer; using the second fin, the second sacrificial layer and the gate structure as a mask to etch the first fin l...

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Abstract

The invention discloses a semiconductor structure and a forming method thereof, and the method comprises the steps: providing a substrate which is provided with a discrete fin part lamination structure; forming a gate structure crossing the fin laminated structure on the substrate; etching the fin part laminated structure by taking the gate structure as a mask to form a second fin part and a second sacrificial layer; etching the first fin part layer and the first sacrificial material layer to form a first fin part and a first sacrificial layer; forming a first source-drain doping layer on the substrate at two sides of the first fin part and the first sacrificial layer; forming a first dielectric layer on the first source-drain doped layer; a second source-drain doping layer is formed on the first dielectric layer; and removing the first sacrificial layer, the second sacrificial layer and the gate structure. According to the scheme, the vertically stacked complementary field effect transistor can be formed, and the performance of the formed semiconductor device is improved.

Description

technical field [0001] The present invention relates to the field of semiconductor integrated circuits, and in particular, to a semiconductor structure and a method for forming the same. Background technique [0002] During the manufacture of semiconductor devices, various manufacturing processes such as film deposition processes, etching mask creation processes, patterning processes, photoresist development processes, material etching and removal processes, and doping processes are performed. These processes are repeatedly performed to form desired semiconductor device elements on the semiconductor substrate. Historically, transistors have been formed using microfabrication in a plane with wiring / metal formed thereon, and thus transistors have been characterized as two-dimensional (2D) circuits or 2D fabrication. Scaling efforts have greatly increased the number of transistors per unit area in 2D circuits, but are becoming more challenging as scaling moves into single-digi...

Claims

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Application Information

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IPC IPC(8): H01L21/8238H01L27/092
CPCH01L21/823821H01L27/0922H01L27/0924
Inventor 张海洋肖杏宇
Owner SEMICON MFG INT (SHANGHAI) CORP