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Method for correcting stray light of hyperspectral radiance instrument and measuring device

A calibration method and a technology of a measuring device, which are applied in the field of optical radiation measurement, can solve problems such as the large influence of stray light and low radiation measurement accuracy, and achieve the effects of improving the signal-to-noise ratio, improving measurement accuracy, and improving the effect

Active Publication Date: 2022-07-12
HEFEI INSTITUTES OF PHYSICAL SCIENCE - CHINESE ACAD OF SCI
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Problems solved by technology

[0004] The purpose of the present invention is to provide a hyperspectral radiance instrument stray light correction method and measuring device to solve the problems of the existing spectrum measurement technology that the stray light has a great influence and the radiation measurement accuracy is low

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  • Method for correcting stray light of hyperspectral radiance instrument and measuring device
  • Method for correcting stray light of hyperspectral radiance instrument and measuring device
  • Method for correcting stray light of hyperspectral radiance instrument and measuring device

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Embodiment Construction

[0036] In order to make the objectives, technical solutions and advantages of the present invention clearer, the present invention will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention, but not to limit the present invention. In addition, the technical features involved in the various embodiments of the present invention described below can be combined with each other as long as they do not conflict with each other.

[0037] like figure 1 As shown, a stray light correction method for a hyperspectral radiance meter includes the following steps:

[0038] Step S1: close the electronic shutter of the device and measure the dark current signal DN of the hyperspectral radiometer detector dark , where DN dark is an n-dimensional column vector, and n corresponds to the number of pixels of the hyperspectral radiometer ...

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Abstract

The invention discloses a stray light correction method and measurement device for a hyperspectral radiance instrument, and the method comprises the steps: building a stray light distribution matrix through measuring the stray light distribution function of each pixel of a detector of the hyperspectral radiance instrument based on a wide-spectrum laser-monochromator system, and carrying out the measurement of the stray light distribution matrix. And a stray light correction matrix is obtained through matrix operation, so that the to-be-corrected detection signal is corrected. A wide-spectrum laser-monochromator measuring device can be utilized to measure the stray light distribution function of any wavelength in a laboratory, the stray light sub-matrix of the working wavelength of the hyperspectral radiance instrument can be measured by adjusting the output wavelength of the monochromator, and the stray light correction matrix is calculated to measure the stray light distribution function of any wavelength of the hyperspectral radiance instrument. Finally, the method is applied to measurement signal correction of a hyperspectral radiance instrument, and the spectral radiation measurement precision is improved.

Description

technical field [0001] The invention belongs to the technical field of optical radiation measurement, and in particular relates to a stray light correction method and a measurement device for a hyperspectral radiance meter. Background technique [0002] Stray light is undetected light that is spectrally distorted by problems such as internal reflections in the instrument, inherent defects in diffraction gratings or filters, and scratches or dust on optical components. It has a great influence on the measurement accuracy of the instrument. For a spectrum analyzer system, the effect of stray light is even more non-negligible. In spectrometers, stray light is an important source of measurement uncertainty in hyperspectral radiometers, especially in spectral regions with low instrument sensitivity or signal-to-noise ratio, such as ultraviolet and near-infrared bands, which directly affect the measurement accuracy of the instrument. Therefore, measurement and correction of stra...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J1/42
CPCG01J1/42Y02A40/10
Inventor 李新陈胜利张权张允祥
Owner HEFEI INSTITUTES OF PHYSICAL SCIENCE - CHINESE ACAD OF SCI
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