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A shielding method and device for measuring infrared radiation on a high-reflective surface

A technology of infrared radiation and radiation shielding, which is applied in measurement devices, optical radiation measurement, radiation pyrometry, etc., and can solve problems such as performance requirement limitations, surface covering coatings or adhesive strips, and original temperature distribution fields affecting high reverse performance. , to achieve the effect of lowering the threshold, reducing cost and technical difficulty, and improving versatility and portability

Active Publication Date: 2017-11-28
YUNNAN ASTRONOMICAL OBSERVATORY CHINESE ACAD OF SCI
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  • Summary
  • Abstract
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  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Coating or glue strip will affect the performance of the high back surface and the original temperature distribution field, only a few points of interest can be measured
Some high-reflective surfaces (such as optical glass, etc.) are limited by performance requirements, and it is difficult to cover their surfaces with coatings or adhesive strips

Method used

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  • A shielding method and device for measuring infrared radiation on a high-reflective surface
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  • A shielding method and device for measuring infrared radiation on a high-reflective surface

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Embodiment Construction

[0030] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0031] A shielding method for high-reflective infrared radiation measurement, comprising the following steps:

[0032] Step 1. Based on the appearance of the high surface and the actual measurement environment, give a suitable measurement orientation, that is, the orientation and distance of the infrared radiation measuring instrument relative to the high surface; evaluate its own infrared radiation intensity according to the emissivity and temperature of the h...

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Abstract

The invention discloses a shielding method and device for infrared radiation measurement on a high-back surface, which can effectively ensure measurement accuracy. The shielding method includes the selection of the measurement orientation and measurement equipment, setting the size of the radiation shielding area, selecting and assembling suitable The shielding device, the installation of an infrared radiation measuring instrument and radiation measurement, and the correction of the influence of the shielding device's own radiation on the measurement results, etc. The invention adopts an open radiation shielding device, which can eliminate the influence of environmental radiation on radiation measurement, greatly increase the proportion of the high-back self-infrared radiation in the total radiation received by the infrared detector, and improve the measurement accuracy of the high-back self-radiation.

Description

technical field [0001] The invention relates to the technical field of infrared radiation measurement on object surfaces, in particular to a shielding method and device for infrared radiation measurement on high-reflective surfaces. Background technique [0002] When measuring infrared radiation, the infrared radiation of the surrounding environment is a non-negligible source of interference. Non-blackbody measured objects always have different reflective abilities, and the ambient infrared radiation can enter the infrared radiation measuring instrument after being reflected by the measured object. Only a part of the total radiation received by the infrared radiation measuring instrument comes from the self-radiation of the measured object, and the interference of environmental radiation on the infrared radiation measurement of the high-reverse surface (smooth object surface with high infrared reflectivity) is particularly serious. When the infrared reflectance of the measu...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01J5/06
Inventor 黄善杰程向明张涛曾光
Owner YUNNAN ASTRONOMICAL OBSERVATORY CHINESE ACAD OF SCI
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