Simple x-ray interferometer

Abstract

Interferometer is composed of X radiation source, two pieces of flat glass, sample and detector. In forward direction of X ray, two pieces of flat glass with included angle being as one second are arranged to receive incident ray in slide over. Two reflected rays passing through sample are interfered. Detector detects interference pattern. Advantages: simple structure, and reliable.

Description

Technical field: [0001] The invention relates to an interferometer, in particular to a simple X-ray interferometer, which can be used to test the spatial coherence of a synchrotron radiation source and a micro-focus X-ray tube and the like. Background technique: [0002] X-rays are essentially electromagnetic radiation like visible light. X-rays also have wave-particle duality, and their particle characteristics include photoelectric effect, incoherent and coherent scattering, and gas ionization. Its volatility includes: phase velocity, phase, reflection, refraction, diffraction, interference and polarization, etc. Since the discovery of X-rays, people have been using these properties to engage in various activities beneficial to human beings, such as the well-known XCT imaging technology. [0003] The nature of the short wavelength of X-rays makes the refractive index in the material a little less than 1, so it is impossible to use optical elements similar to those used in...

AI Technical Summary

Problems solved by technology

The biggest disadvantage of this kind of interferometer is that it needs three high-quality crystals, not only the direction of the crystal faces must be consistent, but also the three crystals must be parallel to each other, which undoubtedly brings difficulties to crystal growth and processing.

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