Static testing system for optical memory specificity

Abstract

A static test system for optical storage characteristics, including two parts: testing and monitoring and observation, characterized in that: the system uses the objective lens in the three-dimensional programmable nano-platform control system to move three-dimensionally, to realize the approach and scanning of the read-write light spot, and to expand The range of measurable samples is expanded, and the measurement automation is realized. In the process of information writing and reading, the light point and the sample can have slow relative motion, so the system can also perform quasi-dynamic testing of optical storage characteristics. The illumination light is introduced into the monitoring and observation system by optical fiber. The optical fiber has high light transmission efficiency, good flexibility, and the length can be processed according to specific conditions, so that the monitoring and observation system has good flexibility.

Description

Technical field: [0001] The invention relates to optical storage materials, in particular to a static test system for optical storage properties. Mainly used for optical storage materials such as CD-R, CD-RW, DVD-R, and DVD-RW Static testing and quasi-dynamic testing of storage properties. technical background: [0002] The static test of optical storage characteristics refers to determining the relationship between the signal contrast and erasing rate of optical storage materials and the writing wavelength, writing power, writing pulse width, erasing wavelength, erasing power and erasing pulse width. During the measurement process, There is no relative movement between the read and write spot and the storage material. The dynamic test of optical storage characteristics refers to the characteristic test when there is relative movement between the read-write light spot and the storage material. [0003] In the prior art, there is a static test system for storage characteri...

AI Technical Summary

Problems solved by technology

[0005] 2) The incandescent lamp is used as the light source in the monitoring and observation system, which requires some beam control components, which makes the observation system less flexible;

[0006] 3) Only static tests can be performed on the storage characteristics of optical storage materials, and nothing can be done for dynamic or quasi-dynamic tests;

[0007] 4) The test system uses the sample scanning method for testing, which has high requirements for samples, which limits the scope of use of the measurement system

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