The invention relates to the technical field of ultrafast
optical storage, in particular to an ultrafast
optical storage material
screening method based on pseudo slippage and a storage device. Screening out a material of which the spatial inversion symmetry is broken and the
band gap is within a preset range as a driving layer material, and screening out a material of which the spatial inversion symmetry is not broken or the
band gap is greater than the
band gap of the driving layer material as a substrate material; performing lattice matching
processing on the driving layer material and the substrate material to construct a
heterojunction structure; performing optical excitation
simulation on the
heterojunction structure, and simulating a
laser excitation process by introducing a time-varying
electric field so as to verify whether the pseudo-slip effect of the
heterojunction structure occurs or not; according to the method,
optical property calculation is carried out on the heterojunction structure with the pseudo-slip effect,
optical property differences before and after pseudo-slip are compared to determine optical parameters of data reading, and limitation of a
material system is broken through while the
power consumption problem is reduced.