Exposure device

A technology of exposure device and exposure system, which is applied in the direction of photolithography exposure device, microlithography exposure equipment, electrical components, etc., can solve the problems of unreasonable structure, error, and low positioning accuracy, and achieve the reduction of deformation and vibration, Improved stability and reduced vibration
CN1658075AInactive Publication Date: 2005-08-24SHANGHAI MICRO ELECTRONICS EQUIP (GRP) CO LTD

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
SHANGHAI MICRO ELECTRONICS EQUIP (GRP) CO LTD
Publication Date
2005-08-24
Estimated Expiration
Not applicable · inactive patent

Smart Images

  • Figure 1
    Figure 1
  • Figure 2
    Figure 2
  • Figure 3
    Figure 3
Patent Text Reader

Abstract

This invention relates to an exposure exposal device, is applied to put the figures that need to be exposed to the sensitive components on the exposure platform and the get large area of figures with the nanometer line width and accuracy. It is composed of the complete appliance frame, the damping system, the accurate movement system, the precision measure system, the alignment system, the precision exposure system and driving electrical system. The complete appliance frame is divided by the damper into the internal frame and the external frame, the driving electrical device is fixed on the external frame. This invention mainly solves the problem of bad damping performance of present technology, and can improve the exposal precision of the device to the level of nanometer exposure.
Need to check novelty before this filing date? Find Prior Art

Description

technical field

[0001] The invention relates to an exposure device, which is used for projecting a pattern to be exposed onto a photosensitive element on an exposure platform according to a certain ratio, so as to obtain a large-area pattern with a certain steepness of nanometer line width and precision. Background technique

[0002] In VLSI optical lithography, the main factor that determines the thinnest line width of fine patterns is the lithography work resolution of the lithography equipment, and the vibration of the whole machine is one of the key factors affecting the lithography resolution. With the improvement of the integration of large-scale integrated circuit devices, the requirements for the resolution of lithography work are getting higher and higher, that is, the stability of the exposure system of the lithography machine, the accuracy of the measurement system and the precision of the motion platform are also getting higher and higher. (At present, the positi...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More