Transistor measuring instrument
Patent Information
- Authority / Receiving Office
- CN · China
- Current Assignee / Owner
- HEILONGJIANG UNIV
- Publication Date
- 2005-11-09
- Estimated Expiration
- Not applicable · inactive patent
Smart Images
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Abstract
Description
Technical field:
[0001] The invention relates to an instrument for identifying the polarity of each pin of a transistor and measuring various parameters of the transistor. Background technique:
[0002] Traditional measuring instruments for various parameters of transistors are generally realized by complex hardware circuits, resulting in high price of finished products, single function, bulky volume, and limited range of use and accuracy. Although there are also intelligent transistor measuring instruments, most of these instruments use special-purpose computers as the core and are equipped with corresponding special-purpose software and hardware boards. Due to the large hardware base of this kind of scheme, they are still bulky and expensive. Invention content:
[0003] The purpose of the present invention is to provide a transistor measuring instrument to overcome the defects of complex structure, large volume and high cost of existing transistor measuring instruments. ...