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Process for titanium nitride removal

A technology of titanium nitride and process gas, applied in the direction of gaseous chemical plating, coating, semiconductor devices, etc., can solve the problems of increasing thermal budget, high temperature, and increasing the cost of processing chambers

Inactive Publication Date: 2006-01-25
AIR PROD & CHEM INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The temperatures taught in this application are as high as 500-700°C, greatly increasing the thermal budget and driving up the cost of the process chamber owner

Method used

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  • Process for titanium nitride removal
  • Process for titanium nitride removal
  • Process for titanium nitride removal

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0045] Example 1: Using Remote NF 3 Combination of plasma and thermal heating to remove titanium nitride

[0046] This example illustrates a method for cleaning process chambers and parts using a combination of remote plasma and thermal heating, NF 3 as a process gas.

[0047] figure 1 A schematic process diagram of the experimental system is shown. A remote plasma generator 10 (MKS ASTRON, available from MKS Instruments of Wilmington, MA) was mounted on top of the reactor 12 . The distance between the outlet 14 of the plasma generator 10 and the coupon 16 was about 6 inches (15.25 cm). The coupon 16 is placed on the surface of a pedestal heater 18 . Use heaters to achieve different substrate temperatures. In all runs, the remote plasma generator was operated with 200 sccm NF 3 A mixture of Ar and 200 sccm was used as the process gas (supplied to the plasma generator 10 through the tube 20), and the chamber pressure was maintained at 4 torr by means of the pump port 22....

Embodiment 2

[0062] Example 2: Using Remote Cl 2 Combination of plasma and thermal heating to remove titanium nitride

[0063] This example illustrates a method for cleaning process chambers and parts using a combination of remote plasma and thermal heating, where Cl 2 as a process gas.

[0064] The test setup is the same as in Example 1.

[0065] Process gas here is 200 sccm Cl 2 and 200 sccm Ar mixture. In remote Cl 2 Under plasma, no etching was observed at 100°C, while at 350°C an etching rate of about 6 nm / min was obtained. Cl 2 gas etch faster than NF 3 Gases etch much slower. According to the CRC Handbook, among the Ti(IV) halides, TiCl 4 Is the most volatile (melting point 25 ° C, boiling point 136 ° C). TiF 4 Has a melting point of 284°C and only sublimes at higher temperatures. Based on this information, chlorine-based reagents should volatilize titanium nitride more readily than fluorine-based reagents. In combined plasma and thermal activation treatments, fluorine ...

Embodiment 3

[0066] Example 3; using NF 3 Thermal energy heating to remove titanium nitride

[0067] This comparative example illustrates a method of cleaning process chambers and parts using thermal energy heating, where NF 3 as a process gas.

[0068] The experimental setup was the same as Examples 1 and 2, except that the remote plasma was turned off and a higher chamber pressure of 8 torr was used.

[0069] NF using 500 sccm 3 flow as process gas. The etch rates of titanium nitride at 350°C and 450°C are about 0.6 nm / min and about 20 nm / min, respectively. Without remote plasma, much higher temperatures are required to remove titanium nitride for the same process gas.

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Abstract

A process of removing titanium nitride from a surface of a substrate includes: providing a process gas including at least one reactant selected from the group consisting of a fluorine-containing substance and a chlorine-containing substance; enriching the process gas with at least one reactive species of the at least one reactant to form an enriched process gas, wherein the enriching is conducted at a first location; providing the substrate at a substrate temperature greater than 50 DEG C, wherein the surface of the substrate is at least partially coated with the titanium nitride; and contacting the titanium nitride on the surface of the substrate with the enriched process gas to volatilize and remove the titanium nitride from the surface of the substrate, wherein the contacting occurs at a second location differing from the first location.

Description

Background of the invention [0001] Titanium nitride is often used as a diffusion barrier in integrated circuits to prevent the diffusion or migration of conductive materials into insulating materials and transistor active regions. It also acts as an adhesion promoter to eliminate delamination and voids between conductive materials and surrounding areas of insulating dielectric materials. During the TiN deposition, residues comprising the final material as well as reactants are deposited along the inner walls onto the surfaces of the reactor internals. To reduce particle formation due to the buildup of these residues, the chambers and components within the reactor must be cleaned regularly. Therefore, there is a need for such efficient methods for removing titanium nitride. [0002] In addition to being useful in semiconductor manufacturing, titanium nitride is often used as a coating in aerospace and automotive applications. Reactors used to deposit titanium nitride films m...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L21/00H01L21/3213H01L21/768H01L21/28C23F1/00
CPCH01L21/32135C23G5/00H01L21/32136C23C16/4405H01L21/3065
Inventor 吴定军齐宾E·J·小卡瓦基
Owner AIR PROD & CHEM INC