Method of testing memory

A memory test and memory technology, applied in static memory, memory systems, instruments, etc., can solve the problems of inability to perform memory test, inability to access and execute data reading and writing or data, so as to improve the memory test range and save test cost effect

A memory test and memory technology, applied in static memory, memory systems, instruments, etc., can solve the problems of inability to perform memory test, inability to access and execute data reading and writing or data, so as to improve the memory test range and save test cost effect

CN1920783AInactive Publication Date: 2007-02-28XUZHOU LIFANG MECHANICAL & ELECTRICAL EQUIP MFG CO LTD

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  • Method of testing memory
  • Method of testing memory

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Embodiment Construction

[0021] Hereinafter, preferred embodiments of the present invention will be described in detail with reference to the accompanying drawings.

[0022] As shown in FIG. 1 , this figure is a flow chart of the overall steps of a memory testing method of the present invention. As shown in the figure, a kind of memory test method of the present invention is applied to the memory detection process in the computer server system or the personal microcomputer system using the Intel central processing unit, and the method includes the following steps:

[0023] Activate the operating system and make the system enter the protection mode of the memory test (step 101). The operating system in this step is preferably a DOS operating system.

[0024] Create an address conversion page table structure (step 102) in the memory, in order to convert the 32-bit linear address given by the system into the physical address of the memory with more than 4GB of physical address space in the subsequent ste...

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Abstract

The invention relates to a memory testing method, wherein it comprises: activating operation system, to make the system enter into protective mode of memory test; building one address transfer page list in memory; judging if the physical address space of memory is over 4GB; if it is, activating address transfer page list, to transform appointed 32-bit linear address to relate with real physical address of memory; controlled by system central processor, based on the address transfer page list, inquiring and accessing the real physical address of memory, and executing the memory test algorism to test memory; if it is not, controlled by system central processor, directly accessing the real physical address of memory relative to the 32-bit linear address of system, and executing memory test algorism to test the memory. The invention can access and test the accidence and failure of memory address space more than 4GB, to improve the memory test range and save test cost.

Description

technical field [0001] The invention relates to a memory testing method, in particular to a memory testing method capable of accessing and testing the memory of a physical address space above 4GB in a computer server system or a personal microcomputer system. Background technique [0002] With the rapid development of computer technology, the operating speed of computer server systems and personal microcomputer systems has been rapidly improved. In order to meet the continuous expansion of memory capacity requirements of programs, the actual storage of physical memory used in computer server systems and personal microcomputer systems The space also increases accordingly, and the memory occupies a very important position in the aforementioned computer server and microcomputer structure. As long as there are slight errors in the memory, it is very likely that the data will be wrong or omitted, and the usage will be caused. Therefore, it is particularly important to access and ...

Claims

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Application Information

Patent Timeline
28 Feb 2007
Publication
CN1920783A
IPC
G06F11/00; G06F12/08; G11C29/00; G06F12/0815; G06F12/1009
Inventors
丁怀亮; 陈玄同