Method for manufacturing a semiconductor pressure sensor
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Benefits of technology
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0029] Hereinafter, an embodiment of a process for manufacturing a semiconductor material sensor of capacitive type is described. The present process is based upon the process disclosed in U.S. application Ser. No. 10 / 327,702 for manufacturing a SOI wafer, and, more precisely, refers to the second embodiment shown in FIGS. 11-14 of said document.
[0030]FIG. 1 shows a wafer 1 of semiconductor material, preferably monocrystalline silicon, comprising an N-type substrate 2, designed to form the bulk of the device. A resist mask 3 (visible in the enlarged detail of FIG. 3) is formed on the top surface of the substrate 2. The mask 3 has two circular areas, designated by 4a and 4b and hereinafter referred to as sensor area and reference area, respectively. In each of these areas, a honeycomb lattice is defined, the two lattices being of different sizes.
[0031] In particular, as appears in the enlarged detail of FIG. 2, the sensor area 4a has mask regions 5a with an hexagonal shape arranged...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com