Plating chemistry and method of single-step electroplating of copper on a barrier metal

a technology of single-step electroplating and copper, which is applied in the direction of basic electric elements, electrical equipment, semiconductor devices, etc., can solve the problems of increasing the current density of such features, not consistently filling the structure of conventional deposition processes, and forming voids in the conductors
US20050274622A1Inactive Publication Date: 2005-12-15APPLIED MATERIALS INC

Patent Information

Authority / Receiving Office
US · United States
Current Assignee / Owner
APPLIED MATERIALS INC
Publication Date
2005-12-15
Estimated Expiration
Not applicable · inactive patent

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Abstract

Embodiments of a method of copper plating a substrate surface with a group VIII metal layer have been described. In one embodiment, a method of plating copper on a substrate surface with a group VIII metal layer comprises pre-treating the substrate surface by removing a group VIII metal surface oxide layer and / or surface contaminants and plating the substrate in a copper plating solution comprising about 50 g / l to about 300 g / l of sulfuric acid at an initial plating current higher than the critical current density to deposit a continuous copper layer on the substrate surface. The Pre-treating the substrate can be accomplished by annealing the substrate in an environment with a hydrogen-containing gas environment and / or a non-reactive gas(es) to Ru, by a cathodic treatment in an acid-containing bath, or by immersing the substrate in an acid-containing bath.
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Description

CROSS-REFERENCE TO OTHER APPLICATIONS

[0001] This application claims the benefit of U.S. provisional patent application Ser. No. 60 / 579,129, entitled “Method Of Barrier Layer Surface Treatment To Enable Direct Copper Plating”, filed on Jun. 10, 2004, and U.S. provisional patent application Ser. No. 60 / 621,215, entitled “Plating Chemistry And Method Of Single-Step Electroplating Of Copper On A Barrier Metal”, filed on Oct. 21, 2004, which is incorporated herein by reference.BACKGROUND OF THE DISCLOSURE

[0002] 1. Field of the Invention

[0003] Embodiments of the invention generally relate to a plating chemistry and a method of electroplating of copper directly on a barrier metal.

[0004] 2. Description of the Background Art

[0005] Sub-quarter micron, multi-level metallization is one of the key technologies for the next generation of very large scale integration (VLSI) and ultra large scale integration (ULSI) semiconductor devices. The multilevel interconnects that lie at the heart of th...

Claims

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