Method of forming a non-volatile electron storage memory and the resulting device

Abstract

The invention provides a method of forming an electron memory storage device and the resulting device. The device comprises a gate structure which, in form, comprises a first gate insulating layer formed over a semiconductor substrate, a self-forming electron trapping layer of noble metal nano-crystals formed over the first gate insulating layer, a second gate insulating layer formed over the electron trapping layer, a gate electrode formed over the second gate insulating layer, and source and drain regions formed on opposite sides of the gate structure.

Description

FIELD OF INVENTION [0001] This invention relates to integrated circuit memory devices, and, more particularly, to a method and device for providing high-density, high-storage capacity, low-power, non-volatile memory devices. BACKGROUND OF THE INVENTION [0002] Non-volatile memory devices which store electrons in nano-crystals instead of floating gates, are presently of great interest, due to potential advantages in memory cell size and power dissipation, compared to memory technologies currently in use. The use of nano-crystals for electron storage will provide greater reliability and low-voltage operation. Research in this area is reported in the article “Volatile and Non-Volatile Memories in Silicon with Nano-Crystal Storage” by Tiwasi et al., IEEE, IEDM, 1995, pgs. 521-524, the disclosure of which is incorporated herein by reference. [0003]FIG. 1 is a sectional view illustrating a floating-gate n-channel MOS electron memory device. In the figure, reference numeral 1 denotes a sili...

AI Technical Summary

Benefits of technology

The invention provides a method for making a semiconductor device with a gate structure that includes a first gate insulating layer and a electron trapping layer containing a noble metal. The use of self-forming nano-crystals eliminates the need for costly mask steps. The device also includes a second gate insulating layer and a gate electrode. The method can be used with different dielectric materials, such as SiO2 or advanced dielectrics like Ta2O5, BaSrTiO3, HfO2, or ZrO2. The resulting device has improved performance and reliability.

Problems solved by technology

The SiO2 gate oxide has a dielectric constant of 3.9 which does not allow scaling and also does not permit low voltage operation.

Also, depending on what control gate oxide is used and subsequent processing steps used, the silicon nano-crystals could oxidize, which would impede or destroy memory device operation.

For example, if a high constant (high-K) dielectric, such as Ta2O5, is used as the control gate oxide to scale the gate threshold voltage for low voltage application, formation of the Ta2O5 control gate oxide could oxidize the silicon nano-crystals destroying the memory cell.

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