Wafer product and processing method therefor
Patent Information
- Authority / Receiving Office
- US ยท United States
- Patent Type
- Applications(United States)
- Current Assignee / Owner
- DENSO CORP
- Publication Date
- 2007-05-17
- Estimated Expiration
- Not applicable ยท inactive patent
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Abstract
Description
CROSS REFERENCE TO RELATED APPLICATION
[0001] This application is based on and incorporates herein by reference Japanese Patent Applications No. 2005-331209 filed on Nov. 16, 2005, No. 2005-331218 filed on Nov. 16, 2005 and No. 2006-196890 filed on Jul. 19, 2006. FIELD OF THE INVENTION
[0002] The present invention relates to a wafer product and a processing method for the wafer product. In particular, the present invention relates to a wafer product that is cut and separated by cutting with a reformed region due to multiphoton absorption, formed by irradiation with laser light, taken as a starting point for cutting and a processing method for the wafer product. BACKGROUND OF THE INVENTION
[0003] Laser dicing technologies have been developed for cutting and separating (dividing) a wafer-like object to be processed into a plurality of chips using laser light.
[0004] For example, a wafer-like object such as a semiconductor substrate to be processed is irradiated with laser light with a...