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Memory cell and fabricating method thereof

a memory cell and manufacturing method technology, applied in the field of memory cells and fabricating methods, can solve the problems of increasing the thermal budget of the process, high power consumption of tft-lcd with such architecture, and not being suitable for transmissive lcd panels

Inactive Publication Date: 2008-01-24
IND TECH RES INST
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  • Abstract
  • Description
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  • Application Information

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Benefits of technology

[0012]Accordingly, the present invention is directed to provide a method of fabricating a memory cell, which c

Problems solved by technology

Therefore, the TFT-LCD with such architecture has a high power-consumption.
Moreover, because the TFTs T1 and T2 adversely affect the aperture ratio of the pixel structure 100, the pixel structure 100 is applicable to a reflective LCD panel, and is not suitable for a transmissive LCD panel.
However, as the above method of forming Ge quantum dots must be carried out under a high temperature, which leading to the increase of the thermal budget of the process.
However, this method is quite complicated and may cause an increase of the thermal budget of the process.

Method used

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  • Memory cell and fabricating method thereof
  • Memory cell and fabricating method thereof

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Embodiment Construction

[0023]Various memory cells and fabricating methods thereof are illustrated in the following embodiments. The memory cell of the present invention has the oxide-quantum dot-oxide structure integrated into the LTPS-TFT, the methods of fabricating the memory cells illustrated in the present invention can be integrated with the LTPS-TFT manufacturing process. In other words, in the pixel structure, when the voltage applied to the control gate is insufficient to carry out “programming” or “erasing”, the following memory cell structure can still be used as a TFT.

[0024]FIGS. 2A to 2F are schematic views of the processes of fabricating the memory cell according to an embodiment of the present invention.

[0025]First, referring to FIG. 2A, a substrate 201 is provided, which is, for example, a glass substrate or other transparent substrates. Then, an amorphous silicon layer 210 is formed on the substrate 201. In the present embodiment, the amorphous silicon layer 210 is, for example, formed by ...

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Abstract

A fabricating method of a memory cell including the following steps is provided. First, a poly-Si island including a source doped region, a drain doped region, and a channel region located therebetween is formed on a substrate. Then, a dielectric layer is formed on the poly-Si island. Afterward, an amorphous silicon-germanium (α-SiGe) layer is formed on the dielectric layer. Next, a laser annealing process is performed to oxidize the α-SiGe layer into a silicon oxide layer, so as to separate out Ge atoms from the α-SiGe layer to form a Ge quantum dot layer between the silicon oxide layer and the dielectric layer. After that, a control gate is formed on the silicon oxide layer.

Description

CROSS-REFERENCE TO RELATED APPLICATION[0001]This application claims the priority benefit of Taiwan application serial no. 95126500, filed on Jul. 20, 2006. All disclosure of the Taiwan application is incorporated herein by reference.BACKGROUND OF THE INVENTION[0002]1. Field of Invention[0003]The present invention relates to a memory cell and a fabricating method thereof. More particularly, the present invention relates to a memory cell having metal-oxide-quantum dot-oxide-polysilicon fabricated on a glass substrate and a fabricating method thereof.[0004]2. Description of Related Art[0005]Due to the features of light-weight and compactness, the liquid crystal display (LCD) and the organic light emitting display (OLED) have gradually become display tools of the portable terminal systems in the last twenty years. In particular, the twist nematic liquid crystal display (TN-LCD), the super twist nematic liquid crystal display (STN-LCD), the thin film transistor liquid crystal display (TF...

Claims

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Application Information

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IPC IPC(8): H01L29/00
CPCB82Y10/00H01L21/28273H01L29/7881H01L29/42332H01L29/66825H01L27/1214H01L29/40114
Inventor CHEN, HUNG-TSE
Owner IND TECH RES INST
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