Products
Solutions
Resources
Pricing
Security
Products
IP
Patent Search & Analysis
Novelty Search
FTO Search
Design FTO Search
Patent Drafting & OAR
SEP Assessment
Engineering
Tech Research & Engineering Solutions
Find Solutions with TRIZ
Life Sciences
Drug Discovery & Research
SAR Data Extraction
Lead Compound
Materials R&D
Materials Research & Development
MCP Servers
REST APIs
Skill Hub
UI Widgets
Desktop
Beta
Solutions
Featured Use Cases
Competitor Tech Research
Design Risk Screening
Cosmetic Formulation
Telecom SEP Claim Chart
Resources
Featured Guides
Patentability Search vs. FTO
Find Prior Art
Review FTO Evidence
Discover
Free AI Tools
Benchmark Reports
Blog & Insights
Support
Help Center
Community & Socials
LinkedIn
X
YouTube
Substack
Pricing
Security
Patents
Literature
Patsnap Eureka AI that helps you search prior art, draft patents, and assess FTO risks, powered by patent and scientific literature data.
2
results about "Amorphous silicon germanium" patented technology
Filter
Efficacy Topic
Property
Owner
Technical Advancement
Application Domain
Technology Topic
Technology Field Word
Patent Country/Region
Patent Type
Patent Status
Application Year
Inventor
Processing method and processing apparatus
Pending
JP2026112132A
Ptru catalyst
Metallurgy
This technology provides a way to easily remove the gettering layer. [Solution] A
processing
method according to one aspect of the present disclosure comprises: preparing a substrate having a
polycrystalline silicon
film containing a catalyst
metal
on its surface; forming a gettering layer on the
polycrystalline silicon
film; and annealing the substrate to diffuse the catalyst
metal
contained in the
polycrystalline silicon
film into the gettering layer, wherein the gettering layer is formed of
amorphous silicon
germanium
containing impurities that enable the
diffusion
of the catalyst
metal
into the gettering layer.
View all
Owner:
TOKYO ELECTRON LTD
Processing method and processing device
PCT designated stage
WO2026140858A1
Ptru catalyst
Metallurgy
A
processing
method according to one aspect of the present disclosure comprises: preparing a substrate comprising, on a surface thereof, a
polycrystalline silicon
film containing a catalyst
metal
; forming a gettering layer on the
polycrystalline silicon
film; and diffusing the catalyst
metal
contained in the
polycrystalline silicon
film into the gettering layer by annealing the substrate. The gettering layer is formed of
amorphous silicon
germanium
containing an
impurity
that enables
diffusion
of the catalyst
metal
into the gettering layer.
View all
Owner:
TOKYO ELECTRON LTD
Login to View More