32results about How to "Short thermal response time" patented technology

The subject invention relates to beam control prisms and the use of a beam control prism to modify the beam properties of light emitted from an edge emitting diode laser. The subject invention can utilize a beam control prism placed next to a diode laser bar. The subject beam control prism can have, for example, a curved surface and/or a high reflective coated surface for a diode laser wavelength. The curved surface can collimate the fast axis divergence and the mirror surface can change the beam direction. The subject curved surface beam control prisms can incorporate one or more features, such as parabolic reflecting surface, elliptical exit surface with flat reflecting surface, and a hyperbolic entrance surface with flat reflecting surface.

The invention discloses a high-sensitivity thermal-response platinum resistor temperature sensor. A thermal conductive metal cap is fixedly embedded at the top end of a metal protecting pipe of the high-sensitivity thermal-response platinum resistor temperature sensor, a platinum resistor inductive core is arranged inside a counter bored hole of the thermal conductive metal cap, a signal transmission cable is in electric connection with the platinum resistor inductive core, transmitting signals are guided out of the metal protecting pipe, thermal-insulating layers are arranged on the internal part of the metal protecting pipe of the thermal conducting inductive cap and outside the counter bored hole of the thermal conducting cap, and the thermal conducting connecting body of the counter bored hole of the thermal conducting cap is linked up with thermal conducting metal points which are embedded in the backside of the insulating substrate of the inductive core of the platinum resistor in a thermal-conducting mode. The high-sensitivity thermal-response platinum resistor temperature sensor improves induction sensitivity of the sensor, shortens thermal response time, and enables the platinum inductive core to be capable of sensing temperature change of environment sensitively and outputting transmission signals of detection.

The invention relates to an infrared detector and a preparation method thereof. The infrared detector comprises a substrate, a thermosensitive layer, a dielectric layer, an electrode layer and a passivation layer, wherein the thermosensitive layer, the dielectric layer, the electrode layer and the passivation layer are located on the substrate, the dielectric layer is located between the thermosensitive layer and the electrode layer, the thermosensitive layer is located on one side, close to the substrate, of the dielectric layer, and the passivation layer is located on one side, away from the substrate, of the electrode layer. The infrared detector comprises a plurality of infrared detector pixels arranged in a matrix, each infrared detector pixel comprises an absorption plate structure, at least two micro-bridge columns and at least two beam structures, and the absorption plate structures are connected to the corresponding micro-bridge columns through the corresponding beam structures; the thermosensitive layer covers the area where the absorption plate structure and the beam structure are located, and the passivation layer covers the area where the absorption plate structure and the beam structure are located; and the material for forming the thermosensitive layer comprises one or more of amorphous silicon, amorphous carbon, amorphous germanium or amorphous silicon germanium. According to the technical scheme, the thermal response time of the infrared detector is shortened, and the infrared response rate of the infrared detector is improved.

The invention discloses an infrared focal plane array and an infrared thermal imaging system based on the infrared focal plane array, and belongs to the field of the infrared thermal imaging. The infrared focal plane array comprises a plurality of array units in periodical arrangement, each array unit comprises a substrate, an insulation support layer, a sub-wavelength grating structure and an infrared absorbing layer; the infrared thermal imaging system based on the infrared focal plane array comprises a wavelength conversion module, a read-out signal production module and an imaging displaymodule; a core element of the wavelength conversion module is the infrared focal plane array; the infrared radiation from a target is focused on the focal plane, the infrared image information of thetarget is converted into the temperature distribution information on the focal plane array; the read-out signal production module is used for producing linear polarization narrow-band near infrared ray and enabling the linear polarization narrow-band near infrared ray to enter the imaging display module after being reflected by the infrared focal plane array, thereby realizing target object visualization. The system disclosed by the invention realizes large-area array, high-pixel, low-cost and quick-response thermal imaging system design.

The invention discloses a connecting shell type solidification temperature measuring device. The device comprises an outer sheath extending into a sensing area. A shell-connecting type temperature measuring assembly is accommodated in the outer sheath to sense the temperature in the sensing area, and is characterized by further comprising an elastic assembly which is matched with the shell-connecting type temperature measuring assembly in a jacking manner and applies downward axial thrust to the shell-connecting type temperature measuring assembly, so that the bottom end of the shell-connecting type temperature measuring assembly is in contact with the inner wall of the bottom end of the outer-layer sheath; and the metallic tin (5) is converted into a liquid phase from a solid phase duringtemperature measurement, then is filled in the inner wall of the bottom end of the outer sheath and submerges the bottom end of the shell type temperature measurement assembly.

A Pt resistance thermometer of small inertia IE grade consists of stainless steel junction box, protection tube, blot, amoured Pt resistive element and measuring end. It is featured as packing metal with perfect heat conduction ability between measuring end shell and Pt resistance in measuring end.