Processor performance adjustment system and method

Abstract

The present invention performance enhancement and reliability maintenance system and method pushes a processor to its maximized performance capabilities when performing processing intensive tasks (e.g., 3D graphics, etc). For example, a clock speed and voltage are increased until an unacceptable error rate begins to appear in the processing results and then the clock speed and voltage are backed off to the last setting at which excessive errors did not occur, enabling a processor at its full performance potential. The present invention also includes the ability to throttle back settings which facilitates the maintenance of desired reliability standards. The present invention is readily expandable to provide adjustment for a variety of characteristics in response to task performance requirements. For example, a variable speed fan that is software controlled can be adjusted to alter the temperature of the processor in addition to clock frequency and voltage.

Description

RELATED APPLICATIONS[0001]This application is a continuation of and claims the benefit of application Ser. No. 10 / 295,619 entitled PROCESSOR PERFORMANCE ADJUSTMENT SYSTEM AND METHOD, (Attorney docket number NVID-P000620) filed on Nov. 14, 2002, which is incorporated herein by this reference.FIELD OF THE INVENTION[0002]The present invention relates to the field of processor operation. More particularly, the present invention relates to a system and method for adjusting graphics processor performance.BACKGROUND OF THE INVENTION[0003]Electronic systems and circuits have made a significant contribution towards the advancement of modern society and are utilized in a number of applications to achieve advantageous results. Numerous electronic technologies such as digital computers, calculators, audio devices, video equipment, and telephone systems facilitate increased productivity and cost reduction in analyzing and communicating data, ideas and trends in most areas of business, science, e...

AI Technical Summary

Benefits of technology

The present invention is a system and method that improves processor performance while maintaining reliability. It pushes a processor to its maximum capabilities when performing intensive tasks, such as 3D graphics, and then backs off to prevent errors. The system can adjust for various operating conditions, such as voltage, frequency, and temperature, and also includes the ability to throttle back settings for reliability standards. The system can run a test to examine the performance of a chip and adjust its settings accordingly. The BIOS can also include a model of how the chip is expected to degrade over time and adjustments to improve performance. Overall, the invention optimizes processor performance while ensuring reliability.

Problems solved by technology

Frequently, these activities involve significant information processing.

However, the speed at which a processor can reliably provide accurate results is limited and typically degrades over time.

Most systems limit processor operation within conservative boundaries and sacrifice possible increased performance so that the processor can meet reliability standards.

However, many graphics presentations, especially interactive 3D graphics presentations, usually require significant processing of large amounts of data at a rapid rate.

Providing image information for each pixel is very data intensive and consumes a significant amount of processing resources.

However, at some point increasing the number of transistors becomes cost prohibitive.

However, increasing the clock frequency is often limited by the characteristics of the transistors utilized to perform the processing.

Higher voltages can be used to sustain operations at a higher clock frequency, and higher clock frequencies and voltage supplies cause a processor to consume more power, thereby increasing the temperature of the processor.

However, higher temperatures generally cause transistors to operate more slowly, causing a lower operational transistor speed.

Continually Running a processor at a high temperature stresses the semiconductor device and reduces long term reliability of the device.

There are a number of factors that can affect the degradation of a transistor's ability to quickly and reliably perform switching operations.

The drain current saturation rating of a transistor can be adversely impacted by the temperature and voltage level at which the transistor is operating, causing deterioration in the transistor switching speed.

These limitations impact maximum clock frequencies since transistor reliability is often degraded by increased voltage levels and temperatures associated with relatively high clock frequencies.

The fixed nominal frequency is typically not the fastest frequency the processor can possibly operate at and resource utilization is not maximized.

To the extent traditional processing systems attempt clock frequency adjustment, they are usually limited to downward adjustments from the fixed nominal clock frequency to achieve power conservation, further limiting the maximization of processor performance speed.

These attempts are also typically limited in scope (such as a single specific adjustment) and usually have limited or no consideration for impacts on processing performance (e.g., maximized processing speed) or environment (e.g., noise level).

Traditional attempts at processor control typically have limited or no consideration for impacts of frequency, voltage and / or temperature adjustments on maximizing performance while maintaining overall lifetime reliability.

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