Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Data run programming

a data run and programming technology, applied in the direction of memory adressing/allocation/relocation, instruments, computing, etc., can solve the problems of less than optimal wear leveling, erroneous data to be read, storage level shift, etc., to reduce the effect of logical fragmentation

Active Publication Date: 2008-06-03
SANDISK TECH LLC
View PDF85 Cites 26 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

The patent describes a method for storing data in a memory array in a way that reduces the impact of logical fragmentation and allows for efficient updating and copying of data. The method involves creating adaptive metablocks that can be tailored to the data being stored and can contain boundaries between data groups. These adaptive metablocks can be programmed in parallel, reducing the amount of data that needs to be copied. The method also includes using non-volatile random access memory (NVRAM) as a data buffer to hold data before it is programmed to flash memory. Overall, the method improves the performance and efficiency of storing data in flash memory arrays.

Problems solved by technology

These storage levels do shift as a result of charge disturbing programming, reading or erasing operations performed in neighboring or other related memory cells, pages or blocks.
Also, shifting charge levels can be restored back to the centers of their state ranges from time-to-time, before disturbing operations cause them to shift completely out of their defined ranges and thus cause erroneous data to be read.
Zones are primarily used to simplify address management such as logical to physical translation, resulting in smaller translation tables, less RAM memory needed to hold these tables, and faster access times to address the currently active region of memory, but because of their restrictive nature can result in less than optimum wear leveling.
Copying unchanged sectors may add to the time required for copying and adds to the space occupied by the data in the memory array because the original metablock may not be used until an erase operation is performed.
Thus, logical fragmentation becomes a greater problem as metablocks become larger.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Data run programming
  • Data run programming
  • Data run programming

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

Memory Architectures and Their Operation

[0101]Referring initially to FIG. 1A, a flash memory includes a memory cell array and a controller. In the example shown, two integrated circuit devices (chips) 11 and 13 include an array 15 of memory cells and various logic circuits 17. The logic circuits 17 interface with a controller 19 on a separate chip through data, command and status circuits, and also provide addressing, data transfer and sensing, and other support to the array 13. A number of memory array chips can be from one to many, depending upon the storage capacity provided. A memory cell array may be located on a single chip or may be comprised of memory cells on multiple chips. The controller and part or the entire array can alternatively be combined onto a single integrated circuit chip but this is currently not an economical alternative.

[0102]A typical controller 19 includes a microprocessor 21, a read-only-memory (ROM) 23 primarily to store firmware and a buffer memory (RAM...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

Data in data runs are stored in a non-volatile memory array in adaptive metablocks that are configured according to the locations of data boundaries. A serial flash buffer is used to store some data, while other data are directly stored in non-volatile memory. Data may be stored with alignment to data boundaries during updating of the data to improve efficiency of subsequent updates.

Description

CROSS-REFERENCE TO RELATED APPLICATION[0001]This application is a continuation-in-part of application Ser. No. 10 / 841,118, by Alan Welsh Sinclair, filed on May 7, 2004, which is a continuation-in-part of application Ser. No. 10 / 749,189, by Alan Welsh Sinclair, filed on Dec. 30, 2003, which applications are hereby incorporated by reference in their entirety.BACKGROUND.[0002]This invention relates generally to the operation of non-volatile memory systems, and, more specifically, to the handling of data within such memory systems.[0003]There are many commercially successful non-volatile memory products being used today, particularly in the form of small form factor cards, which employ an array of flash EEPROM (Electrically Erasable and Programmable Read Only Memory) cells formed on one or more integrated circuit chips. A memory controller, usually but not necessarily on a separate integrated circuit chip, interfaces with a host to which the card is removably connected and controls oper...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(United States)
IPC IPC(8): G06F12/00G06F9/40G06F12/02G06F12/08
CPCG06F12/0246G06F2212/7203G06F9/06G06F12/00
Inventor SINCLAIR, ALAN WELSH
Owner SANDISK TECH LLC
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products