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Thin film transistor display array measuring circuit and method

A thin film transistor and testing circuit technology, applied in the field of pixel storage capacitor testing, can solve the problems of time-consuming, insufficient reliability, weak signal, etc.

Inactive Publication Date: 2008-05-14
PRIMETECH INT CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] This method requires two stages of measurement, which takes a long time, and the signal is weak, the reliability is insufficient, and the accuracy is poor
Does not meet the needs of the industry

Method used

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  • Thin film transistor display array measuring circuit and method
  • Thin film transistor display array measuring circuit and method
  • Thin film transistor display array measuring circuit and method

Examples

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Embodiment Construction

[0041] The content of the present invention can be disclosed through the description of the following embodiments and related drawings. FIG. 2 is a schematic connection diagram of a test circuit 200 for a display circuit of a low temperature polysilicon (Low Temperature Poly-Si) thin film transistor array according to an embodiment of the present invention. Row switch transistor 202 or claim read / write switch transistor, accept the control closed circuit (ON) or open circuit (OFF) of its gate of row switch gate control circuit 220, so that DC charging power supply 214 or test circuit is connected by source and drain Connected to the row, for example, the nth row (n=1 to N, N being the total number of rows), the gate of the pixel switch transistor 204 is connected to the column control column of the kth column (k=1 to K, K being the total number of columns). Gate circuit 216, the source of the pixel switching transistor 204 is connected to the drain of the row switching transis...

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PUM

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Abstract

This invention discloses a kind of test circuit and its method of film transistor display circuit. It is used to test the quality of the film transistor array. The circuit comprises an array testing machine table, a table socket that used to place the tested object, a sensing amplifier array. Its feature is that it is consisted by several transimpedance amplifier unit and parasitic capacitance discharge circuit. The sensing amplifier includes a transimpedance amplifier unit which is consisted by a operational amplifier, two switches and a operation capacitor. The transimpedance amplifier unit is used to form integrating circuit; its output is transferred to sampling / retaining circuit by a output switch, and then conversed into digital signal by analog digital converter. The source electrode line parasitic capacitance discharge circuit of film transistor array is used to form discharge path of electric charge of the parasitic capacitance.

Description

technical field [0001] The invention relates to a testing method of a circuit, in particular to a testing method of a pixel storage capacitance of a thin film transistor display circuit. In situations where the parasitic capacitance is much larger than the pixel capacitance, reliable and precise measurements of pixel quality can be obtained. Background technique [0002] Liquid crystal display (LCD) or organic light-emitting diode display panel (OLED) has more and more pixels, and the area of ​​large-area displays is getting larger and larger. The source parasitic capacitance Csp of the thin-film transistor (TFT) array is much larger than that of the pixel (Pixel) The storage capacitor Cs. When measuring the finished product in the quality management stage, the obtained measurement signal is too small and the accuracy is insufficient. [0003] Generally, to measure whether the pixel capacitance is good, the pixel capacitance is first charged with a voltage of several volts...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/00G01R31/28
Inventor 郭光义田孝通
Owner PRIMETECH INT CORP
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