Chip packaging structure and manufacturing method therefor
A technology of chip packaging and manufacturing methods, applied in semiconductor/solid-state device manufacturing, electrical components, electrical solid-state devices, etc., can solve problems such as electrical short circuit, electrical open circuit, and the third bonding wire 150 is easy to collapse, so as to improve reliability Degree, the effect of improving production yield
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no. 1 example
[0053] Figure 2A A schematic side view sectional view of a chip package structure according to the first embodiment of the present invention is shown, and Figure 2B draw Figure 2A A schematic top view of the lead frame of the chip package structure. Please refer to Figure 2A and Figure 2B The chip package structure 200 of the first embodiment includes a chip 210 , a lead frame 220 , a plurality of first bonding wires 230 and a plurality of second bonding wires 240 . The chip 210 has an active surface 212 and a plurality of chip pads 214 , wherein the chip pads 214 are disposed on the active surface 212 . In addition, these chip pads 214 can be ground pads, power pads or signal pads.
[0054] The lead frame 220 is fixed on the chip 210 , and the lead frame 220 includes a plurality of inner leads 222 , at least one bus frame 224 , an insulating layer 226 and a plurality of transfer pads 228 . The bus frame 224 is located between the chip pads 214 and the inner pins 22...
no. 2 example
[0064] Figure 4A A schematic side sectional view of a chip package structure according to the second embodiment of the present invention is shown, and Figure 4B draw Figure 4A A schematic top view of the lead frame of the chip package structure. Please refer to Figure 4A and Figure 4B The main difference between the chip package structure 300 of the second embodiment and the chip package structure 200 of the first embodiment is that: the lead frame 320 of the chip package structure 300 includes a chip seat P, a plurality of inner pins 322, at least— The bus frame 324 , an insulating layer 326 and a plurality of transfer pads 328 . The wafer 310 is disposed on the wafer seat P, and the active surface 312 is away from the wafer seat P. As shown in FIG. In other words, just Figure 4A In terms of relative position, the active surface 312 of the wafer 310 is facing upward. In addition, the busbar 324 is located between the wafer pad P and the inner pins 322 .
[0065]...
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