Laser splash radiation ionization cold focusing right crossing flying time mass spectrograph

Abstract

A laser sputtering ionization cold focusing orthogonal time-of-flight mass spectrometer relates to a mass spectrometer. Provided is a laser sputtering ionization cold-focus orthogonal time-of-flight mass spectrometer that matches a laser ionization source with a mass spectrometer, removes interference peaks, provides clear spectrograms, and analyzes solid samples without a standard sample. A laser, a focusing lens group, a sampling probe rod, a two-dimensional mobile platform, an ion source cavity, a main cavity, a sampling cone, a radio frequency multipole rod, a skimmer cone, an ion lens group and a time-of-flight mass analyzer are provided. The laser and focusing lens are set outside the ion source cavity, and the sample injection probe, two-dimensional mobile platform and sampling cone are set inside the ion source cavity; the wall of the ion source cavity is equipped with quartz windows, vacuum ports and valves; the main cavity A vacuum port is set on the wall of the body cavity, and the skimmer, radio frequency multi-stage rod and ion lens group are arranged in the main cavity; the sampling probe rod, two-dimensional mobile platform and sampling cone are the same as the skimmer cone, radio frequency multi-stage rod and ion lens group. axis.

Description

technical field [0001] The invention relates to a mass spectrometer, in particular to a laser sputtering ionization cold focusing orthogonal time-of-flight mass spectrometer. Background technique [0002] The analysis of elements in solid samples plays an important role in the fields of metallurgy, geology, mining, environmental protection, national defense, and semiconductor industry. Solid samples are usually dissolved and digested with strong acid, and then detected by atomic spectroscopy or mass spectrometry. In recent years, direct analysis methods of solid samples have attracted more and more attention. Compared with solid dissolution analysis, direct analysis can save a lot of sample preparation time, especially in the case of solid samples that are difficult to dissolve or are very toxic. In addition, the direct analysis method avoids problems such as pollution and loss during the sample dissolution process, thereby obtaining more accurate experimental results. The...

AI Technical Summary

Problems solved by technology

The ions produced by laser sputter ionization have an energy dispersion of up to thousands of electron volts, making conventional mass spectrometers unbearable

A small amount of low ionization energy elements are excessively ionized, resulting in divalent or multivalent ions, which seriously interfere with the analysis of spectra

Moreover, in the traditional laser sputtering ionization mass spectrometer, the ionization process is carried out in a vacuum, and the ions have a large energy dispersion, and these ions are introduced into the mass analyzer without cooling, and the ions with different mass-to-charge ratios cannot be effectively separated. , the resolving power of the instrument is greatly reduced

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