In order to provide an atmospheric pressure ionization mass spectrometer system which allows for equal high sensitivity analysis for LCs with different flow rates, there is provided an atmospheric pressure ionization mass spectrometer system comprising: an atmospheric pressure ion source for ionizing a sample solution under atmospheric pressure, a mass spectrometer for mass analyzing the ions in an evacuated space, a fine hollow tube on a partition wall between the atmospheric pressure ion source and the mass spectrometer, the ions generated in the atmospheric pressure ion source being introduced through the fine tube into the mass spectrometer to be mass analyzed, wherein the fine tube consists of a first fine tube and a second fine tube which are different in diameter, the second fine tube being inserted in the first fine tube, the ions and gas generated in the atmospheric pressure ion source are introduced into the mass spectrometer through the second fine tube, and a gas is fed into a space between the first fine tube and the second fine tube. The present invention allows for high sensitivity measurements of mass spectrometer systems including the micro LC, CE, and nanospray with very low flow rate and the conventional LC with much higher flow rate. In addition, the clogged fine tube can be exchanged without stopping the vacuum pumping, providing the simplified maintenance.