Atmospheric-pressure ionization mass-spectrograph apparatus

An atmospheric pressure ionization and mass spectrometer technology, applied in mass spectrometers, dynamic spectrometers, electronic/ion optical devices, etc., can solve the problems of mass spectrometry quality decline, analysis obstacles, and undesired, and achieve the effect of easy analysis and improved accuracy.

Active Publication Date: 2013-03-13
SHIMADZU SEISAKUSHO CO LTD
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Problems solved by technology

When cluster ions are generated, undesired peaks appear in the mass spectrum, and the peak pattern of the mass spectrum becomes complicated, which hinders the analysis
In addition, there are also cases where the ions obtained by sampling combine with mobile phase solvent molecules along with adiabatic expansion, thereby not only complicating the peak pattern of the mass spectrum, but also generating dimers and trimers of mobile phase solvent ions. bodies, etc., which become background noise, causing degradation of the chromatogram
[0008] In existing atmospheric pressure ionization mass spectrometers, the influence of background n

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Embodiment Construction

[0034] Next, an embodiment of the atmospheric pressure ionization mass spectrometer according to the present invention will be described with reference to the drawings.

[0035] figure 1 It is a schematic structural diagram of the main part of the atmospheric pressure ionization mass spectrometer of the present embodiment, figure 2 (A) is based on figure 1 A detailed diagram centered on the first-stage intermediate vacuum chamber in .

[0036] The mass spectrometer is, for example, provided with two intermediate vacuum chambers 6, 9 between an ionization chamber 1 and an analysis chamber 12, wherein the ionization chamber 1 is equipped with a spray nozzle 2 for supplying a liquid sample from the column outlet end of an LC not shown, The analysis chamber 12 is provided with a quadrupole mass filter 13 and a detector 14, and the two intermediate vacuum chambers 6, 9 are respectively separated by partition walls to form a first-stage intermediate vacuum chamber and a second-...

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Abstract

Inside a first-stage intermediate vacuum chamber (6) of an atmospheric-pressure ionization mass-spectrograph apparatus, cluster ions that are the cause of background noise are generated mainly at area (A), and fragment ions are generated mainly at area (B). Accordingly, in cases of in-source CID analysis mode, a DC voltage that is lower than that of a skimmer (8) is applied to a first ion guide (7), so that an accelerating electric field is generated at area (B). This enables sufficient energy to be given to the ions, to facilitate fragmentation. In cases when in-Source CID analysis is not conducted, a DC voltage that is lower than that of the first ion guide (7) is applied to the exit end (3b) of a desolvation tube (3), so that no electric field is generated at area (B) and an accelerating electric field is generated only at area (A). This enables inhibition of generation of both the cluster ions and the fragment ions, and attainment of a high-quality chromatogram.

Description

technical field [0001] The present invention relates to an atmospheric pressure ionization mass spectrometer, which, like a liquid chromatography mass spectrometer, ionizes a liquid sample in an approximately atmospheric pressure environment and performs mass analysis in a high vacuum environment. Background technique [0002] In liquid chromatography-mass spectrometry (LC / MS), which combines a liquid chromatograph (LC) and a mass spectrometer (MS), in order to generate gas ions from a liquid sample, the electrospray ionization method ( Atmospheric pressure ion sources obtained by ESI), atmospheric pressure chemical ionization (APCI), etc. In an atmospheric pressure ionization mass spectrometer using such an atmospheric pressure ion source, the ionization chamber where ions are generated is in a substantially atmospheric pressure environment, and the analysis chamber equipped with a mass analyzer such as a quadrupole mass filter and a detector must maintain a high vacuum sta...

Claims

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Application Information

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IPC IPC(8): H01J49/06G01N27/62
CPCH01J49/04H01J49/34H01J49/42H01J49/067H01J49/044
Inventor 向畑和男奥村大辅
Owner SHIMADZU SEISAKUSHO CO LTD
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