Method for reinforcing optical capturing effect of thin film photovoltaic device
A photovoltaic device and thin-film silicon technology, applied in the field of solar photovoltaic equipment, can solve the problem that the reflected light cannot reach the critical angle, etc.
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[0011] As shown in the accompanying drawing, a p-i-n type photovoltaic device comprises: a glass substrate 1; a transparent conductive front contact layer 2, a boron-doped p-layer 6 based on thin-film silicon, an intrinsic thin-film silicon-based i-layer 8 , a phosphorus-doped n-layer 9 based on thin-film silicon and a highly reflective back electrode composed of metal oxide 22 and metal film 45 . When the p-i-n layer is obtained by plasma-enhanced chemical vapor deposition, the present invention intentionally makes the n-layer relatively thick, such as not less than 300 nanometers. After this, the device is treated with an etch plasma, using plasma source gases including hydrogen, fluorine-containing gases, and chlorine-containing gases, such as NF 3 , CCl 4 . This plasma etching process is carried out under relatively high pressure, such as greater than 4mbar, and at relatively high power, so that the etching process has obvious regional and non-uniformity. As a result, t...
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