Semiconductor laser radar visibility meter

A laser radar and semiconductor technology, applied in the field of visibility meter and semiconductor laser radar visibility meter, can solve the problems of high cost, large volume, and difficulty in promotion and popularization.

Inactive Publication Date: 2009-11-18
ANHUI INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] The problem to be solved by the present invention is to provide a semiconductor laser radar visibility meter. The system can quickly detect the horizontal and slope visibility, and the detection angle can be adjusted arbitrarily, which expands the detection range and func

Method used

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  • Semiconductor laser radar visibility meter
  • Semiconductor laser radar visibility meter
  • Semiconductor laser radar visibility meter

Examples

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Example Embodiment

[0032] See figure 1 , A semiconductor laser radar visibility instrument, including a laser emitting system, a receiving optical system, a signal acquisition and control system, the laser emitting system includes a semiconductor laser 1, a coupling lens 2, a first coupling fiber 3, a transmitting telescope 4 and a reflection The plane mirror 5 with transmission function, the exit port of the semiconductor laser 1 is provided with a coupling lens 2, the focal point of the coupling lens 2 is provided with a first coupling fiber 3, and the light exit port of the first coupling fiber 3 is provided at the focal point of the laser emitting telescope 4, The front end of the transmitting telescope 4 is provided with a flat mirror 5 with reflection and transmission functions. Part of the laser light reflected from the flat mirror 5 with reflection and transmission functions is received by the photodiode 6 arranged at the focal point of the transmitting telescope, and the photodiode 6 will ...

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Abstract

The invention discloses a semiconductor laser radar visibility meter which comprises a laser emission system, a receiving optical system, and a signal collecting and control system, and is characterized in that: the laser emission system comprises a semiconductor laser, a coupling lens, a first coupling optical fiber, a transmitter-telescope, and a flat mirror with reflection and transmission functions; the receiving optical system comprises a receiving telescope, a second coupling optical fiber, a photodetector, and an amplifier; the signal collecting and control system comprises an AD collecting card, a computer and a door control system; and the AD collecting card is connected with the computer by a stacked way. The visibility meter has small and convenient structure, strong applicability and simple operation, can measure horizontal and slant visibility data in real time, and provides reliable visibility information for the fields of meteorology, transportation, environmental protection and military and the like.

Description

technical field [0001] The invention relates to a visibility meter used in the fields of transportation, meteorology, environmental protection, military affairs and the like, in particular to the field of a semiconductor laser radar visibility meter. Background technique [0002] Visibility is a routine item in meteorological observation. It reflects the turbidity of the atmosphere. Low visibility conditions such as heavy fog will affect traffic safety and military operations. At present, the measurement of horizontal visibility has been relatively accurate, and relatively mature products include atmospheric transmissometers and so on. Since the vertical distribution of the atmosphere is not uniform, the atmospheric visibility will decrease with the increase of altitude. Therefore, the visibility in the squint direction will be quite different from the visibility measured horizontally. When there is surface fog, the horizontal visibility is very low and the slope visibility...

Claims

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Application Information

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IPC IPC(8): G01S17/95G01N21/47
CPCY02A90/10
Inventor 唐磊岳斌董晶晶董吉辉舒志峰孙东松沈法华
Owner ANHUI INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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